Rui-Huang Cheng

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Taipei County, TW

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Patents Grantslast 30 patents

Information Patent Grant
Test-key for checking interconnect
- Patent number 8,278,765
- Issue date Oct 2, 2012
- United Microelectronics Corp.
- Yeh-Sheng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test-key for checking interconnect and corresponding checking method
- Patent number 7,514,278
- Issue date Apr 7, 2009
- United Microelectronics Corp.
- Yeh-Sheng Cheng
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CAPACITOR STRUCTURE AND FABRICATING METHOD THEREOF
- Publication number 20160093687
- Publication date Mar 31, 2016
- UNITED MICROELECTRONICS CORPORATION
- Chien-Li KUO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITOR STRUCTURE AND FABRICATING METHOD THEREOF
- Publication number 20140061855
- Publication date Mar 6, 2014
- UNITED MICROELECTRONICS CORPORATION
- Chien-Li KUO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING INTEGRATED CIRCUIT AND SEMICONDUCTOR STRUC...
- Publication number 20090166796
- Publication date Jul 2, 2009
- Chi-Lu Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST-KEY FOR CHECKING INTERCONNECT AND CORRESPONDING CHECKING METHOD
- Publication number 20090065775
- Publication date Mar 12, 2009
- United Microelectronics Corp.
- Yeh-Sheng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST-KEY FOR CHECKING INTERCONNECT AND CORRESPONDING CHECKING METHOD
- Publication number 20070049049
- Publication date Mar 1, 2007
- Yeh-Sheng Cheng
- H01 - BASIC ELECTRIC ELEMENTS