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Rui Ni
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Shanghai, CN
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last 30 patents
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Patent Grant
Magneto-optic Kerr effect metrology systems
Patent number
11,043,239
Issue date
Jun 22, 2021
KLA Corporation
Jun Wang
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
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Patent Application
REFLECTIVE COMPACT LENS FOR MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEM
Publication number
20220137380
Publication date
May 5, 2022
KLA Corporation
Alex ZHENG
G02 - OPTICS
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Patent Application
MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEMS
Publication number
20200302965
Publication date
Sep 24, 2020
KLA Corporation
Jun Wang
G11 - INFORMATION STORAGE