Ruifang Shi

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Cupertino, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Database-driven cell-to-cell reticle inspection
- Patent number 8,914,754
- Issue date Dec 16, 2014
- KLA-Tencor Corporation
- Carl Hess
- G01 - MEASURING TESTING
Information Patent Grant
Wafer plane detection of lithographically significant contamination...
- Patent number 8,611,637
- Issue date Dec 17, 2013
- KLA-Tencor Corporation
- Ruifang Shi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reticle defect inspection with model-based thin line approaches
- Patent number 8,103,086
- Issue date Jan 24, 2012
- KLA-Tencor Corporation
- Ruifang Shi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Process window optical proximity correction
- Patent number 7,493,590
- Issue date Feb 17, 2009
- KLA-Tencor Technologies Corporation
- Carl Hess
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Database-Driven Cell-to-Cell Reticle Inspection
- Publication number 20130111417
- Publication date May 2, 2013
- KLA-TENCOR CORPORATION
- Carl Hess
- G01 - MEASURING TESTING
Information Patent Application
Wafer Plane Detection of Lithographically Significant Contamination...
- Publication number 20110299758
- Publication date Dec 8, 2011
- KLA-Tencor Corporation
- Ruifang Shi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
RETICLE DEFECT INSPECTION WITH MODEL-BASED THIN LINE APPROACHES
- Publication number 20110299759
- Publication date Dec 8, 2011
- KLA-Tencor Corporation
- Ruifang Shi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY