Ruifeng Guo

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Adaptive cell-aware test model for circuit diagnosis
- Patent number 11,573,873
- Issue date Feb 7, 2023
- Synopsys, Inc.
- Ruifeng Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Advanced cell-aware fault model for yield analysis and physical fai...
- Patent number 11,379,649
- Issue date Jul 5, 2022
- Synopsys, Inc.
- Ruifeng Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cell-aware defect characterization by considering inter-cell timing
- Patent number 11,334,698
- Issue date May 17, 2022
- Synopsys, Inc.
- Ruifeng Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cell-aware defect characterization for multibit cells
- Patent number 10,528,692
- Issue date Jan 7, 2020
- Synopsis, Inc.
- Ruifeng Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cell-aware defect characterization and waveform analysis using mult...
- Patent number 10,515,167
- Issue date Dec 24, 2019
- Synopsys, Inc.
- Ruifeng Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating test sets for diagnosing scan chain failures
- Patent number 9,977,080
- Issue date May 22, 2018
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Grant
Test access architecture for stacked memory and logic dies
- Patent number 9,689,918
- Issue date Jun 27, 2017
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Test architecture for characterizing interconnects in stacked designs
- Patent number 9,335,376
- Issue date May 10, 2016
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional scan architecture
- Patent number 9,222,978
- Issue date Dec 29, 2015
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Fault dictionary based scan chain failure diagnosis
- Patent number 9,110,138
- Issue date Aug 18, 2015
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Grant
Detection and diagnosis of scan cell internal defects
- Patent number 9,086,459
- Issue date Jul 21, 2015
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Grant
Faulty chains identification without masking chain patterns
- Patent number 9,057,762
- Issue date Jun 16, 2015
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosis-aware scan chain stitching
- Patent number 9,015,543
- Issue date Apr 21, 2015
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Generating test sets for diagnosing scan chain failures
- Patent number 8,935,582
- Issue date Jan 13, 2015
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Grant
Compound hold-time fault diagnosis
- Patent number 8,862,956
- Issue date Oct 14, 2014
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for scan chain diagnosis
- Patent number 8,689,070
- Issue date Apr 1, 2014
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Test pattern generation for diagnosing scan chain failures
- Patent number 8,661,304
- Issue date Feb 25, 2014
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Grant
Fault dictionary-based scan chain failure diagnosis
- Patent number 8,615,695
- Issue date Dec 24, 2013
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic test pattern generation for small delay defect
- Patent number 8,527,232
- Issue date Sep 3, 2013
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Grant
Speed-path debug using at-speed scan test patterns
- Patent number 8,468,409
- Issue date Jun 18, 2013
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Grant
Test pattern generation for diagnosing scan chain failures
- Patent number 8,316,265
- Issue date Nov 20, 2012
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Grant
Generating test sets for diagnosing scan chain failures
- Patent number 8,261,142
- Issue date Sep 4, 2012
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Grant
Generating test sets for diagnosing scan chain failures
- Patent number 8,171,357
- Issue date May 1, 2012
- Mentor Graphics Corporation
- Ruifeng Guo
Information Patent Grant
Diagnosing mixed scan chain and system logic defects
- Patent number 7,788,561
- Issue date Aug 31, 2010
- Yu Huang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Cell-Aware Defect Characterization by Considering Inter-Cell Timing
- Publication number 20210342511
- Publication date Nov 4, 2021
- Synopsys, Inc.
- Ruifeng Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADVANCED CELL-AWARE FAULT MODEL FOR YIELD ANALYSIS AND PHYSICAL FAI...
- Publication number 20210240905
- Publication date Aug 5, 2021
- Synopsys, Inc.
- Ruifeng Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CELL-AWARE DEFECT CHARACTERIZATION AND WAVEFORM ANALYSIS USING MULT...
- Publication number 20180039721
- Publication date Feb 8, 2018
- Synopsys, Inc.
- Ruifeng Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING TEST SETS FOR DIAGNOSING SCAN CHAIN FAILURES
- Publication number 20150226796
- Publication date Aug 13, 2015
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Application
Test Architecture for Characterizing Interconnects in Stacked Designs
- Publication number 20140237310
- Publication date Aug 21, 2014
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Application
FAULT DICTIONARY BASED SCAN CHAIN FAILURE DIAGNOSIS
- Publication number 20140115413
- Publication date Apr 24, 2014
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Application
Diagnosis-Aware Scan Chain Stitching
- Publication number 20130166976
- Publication date Jun 27, 2013
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Application
TEST PATTERN GENERATION FOR DIAGNOSING SCAN CHAIN FAILURES
- Publication number 20130080849
- Publication date Mar 28, 2013
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Application
Two-Dimensional Scan Architecture
- Publication number 20120233512
- Publication date Sep 13, 2012
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Application
GENERATING TEST SETS FOR DIAGNOSING SCAN CHAIN FAILURES
- Publication number 20120216088
- Publication date Aug 23, 2012
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Application
Compound Hold-Time Fault Diagnosis
- Publication number 20120210184
- Publication date Aug 16, 2012
- Yu Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Detection And Diagnosis Of Scan Cell Internal Defects
- Publication number 20110191643
- Publication date Aug 4, 2011
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Application
Timing Failure Debug
- Publication number 20110035638
- Publication date Feb 10, 2011
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Application
Method And System For Scan Chain Diagnosis
- Publication number 20100293422
- Publication date Nov 18, 2010
- Mentor Graphics Corporation
- Yu Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Diagnostic Test Pattern Generation For Small Delay Defect
- Publication number 20100274518
- Publication date Oct 28, 2010
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Application
Speed-Path Debug Using At-Speed Scan Test Patterns
- Publication number 20100185908
- Publication date Jul 22, 2010
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Application
TEST PATTERN GENERATION FOR DIAGNOSING SCAN CHAIN FAILURES
- Publication number 20090235134
- Publication date Sep 17, 2009
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Application
Fault dictionary-based scan chain failure diagnosis
- Publication number 20080250284
- Publication date Oct 9, 2008
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Application
Generating test sets for diagnosing scan chain failures
- Publication number 20080215943
- Publication date Sep 4, 2008
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSING MIXED SCAN CHAIN AND SYSTEM LOGIC DEFECTS
- Publication number 20080040637
- Publication date Feb 14, 2008
- Yu Huang
- G01 - MEASURING TESTING

Ruifeng Guo

Person

Patents Grantslast 30 patents

Adaptive cell-aware test model for circuit diagnosis

Advanced cell-aware fault model for yield analysis and physical fai...

Cell-aware defect characterization by considering inter-cell timing

Cell-aware defect characterization for multibit cells

Cell-aware defect characterization and waveform analysis using mult...

Generating test sets for diagnosing scan chain failures

Test access architecture for stacked memory and logic dies

Test architecture for characterizing interconnects in stacked designs

Two-dimensional scan architecture

Fault dictionary based scan chain failure diagnosis

Detection and diagnosis of scan cell internal defects

Faulty chains identification without masking chain patterns

Diagnosis-aware scan chain stitching

Generating test sets for diagnosing scan chain failures

Compound hold-time fault diagnosis

Method and system for scan chain diagnosis

Test pattern generation for diagnosing scan chain failures

Fault dictionary-based scan chain failure diagnosis

Diagnostic test pattern generation for small delay defect

Speed-path debug using at-speed scan test patterns

Test pattern generation for diagnosing scan chain failures

Generating test sets for diagnosing scan chain failures

Generating test sets for diagnosing scan chain failures

Diagnosing mixed scan chain and system logic defects

Patents Applicationslast 30 patents

Cell-Aware Defect Characterization by Considering Inter-Cell Timing

ADVANCED CELL-AWARE FAULT MODEL FOR YIELD ANALYSIS AND PHYSICAL FAI...

CELL-AWARE DEFECT CHARACTERIZATION AND WAVEFORM ANALYSIS USING MULT...

GENERATING TEST SETS FOR DIAGNOSING SCAN CHAIN FAILURES

Test Architecture for Characterizing Interconnects in Stacked Designs

FAULT DICTIONARY BASED SCAN CHAIN FAILURE DIAGNOSIS

Diagnosis-Aware Scan Chain Stitching

TEST PATTERN GENERATION FOR DIAGNOSING SCAN CHAIN FAILURES

Two-Dimensional Scan Architecture

GENERATING TEST SETS FOR DIAGNOSING SCAN CHAIN FAILURES

Compound Hold-Time Fault Diagnosis

Detection And Diagnosis Of Scan Cell Internal Defects

Timing Failure Debug

Method And System For Scan Chain Diagnosis

Diagnostic Test Pattern Generation For Small Delay Defect

Speed-Path Debug Using At-Speed Scan Test Patterns

TEST PATTERN GENERATION FOR DIAGNOSING SCAN CHAIN FAILURES

Fault dictionary-based scan chain failure diagnosis

Generating test sets for diagnosing scan chain failures

DIAGNOSING MIXED SCAN CHAIN AND SYSTEM LOGIC DEFECTS