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Kobe-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Sample analyzer and method for controlling a sample analyzer
Patent number
9,989,469
Issue date
Jun 5, 2018
SYSMEX CORPORATION
Masakazu Fukuda
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer
Patent number
9,086,402
Issue date
Jul 21, 2015
Sysmex Corporation
Rumi Takata
G01 - MEASURING TESTING
Information
Patent Grant
Bacteria analyzer, bacteria analyzing method and computer program p...
Patent number
8,476,066
Issue date
Jul 2, 2013
Sysmex Corporation
Rumi Takata
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Apparatus for analyzing particles in urine and method thereof
Patent number
8,333,926
Issue date
Dec 18, 2012
Sysmex Corporation
Yousuke Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Sample processing apparatus and sample processing system
Patent number
8,083,995
Issue date
Dec 27, 2011
Sysmex Corporation
Keisuke Tsutsumida
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SAMPLE ANALYZER AND METHOD FOR CONTROLLING A SAMPLE ANALYZER
Publication number
20130260415
Publication date
Oct 3, 2013
SYSMEX CORPORATION
Masakazu FUKUDA
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER
Publication number
20110169837
Publication date
Jul 14, 2011
SYSMEX CORPORATION
Rumi TAKATA
G01 - MEASURING TESTING
Information
Patent Application
Bacteria analyzer, bacteria analyzing method and computer program p...
Publication number
20100047856
Publication date
Feb 25, 2010
Sysmex Corporation
Rumi Takata
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS AND SAMPLE PROCESSING SYSTEM
Publication number
20080206098
Publication date
Aug 28, 2008
SYSMEX CORPORATION
Keisuke TSUTSUMIDA
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for analyzing particles in urine and method thereof
Publication number
20070269897
Publication date
Nov 22, 2007
SYSMEX CORPORATION
Yousuke Tanaka
G01 - MEASURING TESTING