RUNSHUN WANG

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Patents Grantslast 30 patents

Information Patent Grant
Method of fabricating an air gap
- Patent number 12,191,195
- Issue date Jan 7, 2025
- United Microelectronics Corp.
- Bo Tao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etch stop detection structure and etch stop detection method
- Patent number 12,142,519
- Issue date Nov 12, 2024
- United Microelectronics Corp.
- Runshun Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating semiconductor device
- Patent number 11,417,735
- Issue date Aug 16, 2022
- United Microelectronics Corp.
- Zhuona Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layout of semiconductor transistor device
- Patent number 10,727,234
- Issue date Jul 28, 2020
- United Microelectronics Corp.
- Zhibiao Zhou
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ETCH STOP DETECTION STRUCTURE AND ETCH STOP DETECTION METHOD
- Publication number 20230343639
- Publication date Oct 26, 2023
- United Microelectronics Corp.
- Runshun Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING AN AIR GAP
- Publication number 20230058468
- Publication date Feb 23, 2023
- UNITED MICROELECTRONICS CORP.
- BO TAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
- Publication number 20210305377
- Publication date Sep 30, 2021
- United Microelectronics Corp.
- Zhuona Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE OF MEMORY DEVICE AND METHOD FOR FABRICATING MEMORY DEVICE
- Publication number 20210020696
- Publication date Jan 21, 2021
- United Microelectronics Corp.
- Runshun Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAYOUT of SEMICONDUCTOR TRANSISTOR DEVICE
- Publication number 20180151571
- Publication date May 31, 2018
- UNITED MICROELECTRONICS CORP.
- ZHIBIAO ZHOU
- H01 - BASIC ELECTRIC ELEMENTS