Ruriko Tsuneta

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for estimating shape before shrink and CD-SEM apparatus
- Patent number 9,830,524
- Issue date Nov 28, 2017
- Hitachi High-Technologies Corporation
- Tomoko Sekiguchi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electric charged particle beam microscope and electric charged part...
- Patent number 8,993,961
- Issue date Mar 31, 2015
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam microscope, sample holder for charged particl...
- Patent number 8,963,102
- Issue date Feb 24, 2015
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specified position identifying method and specified position measur...
- Patent number 8,442,300
- Issue date May 14, 2013
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-part specimen holder with conductive patterns
- Patent number 8,334,519
- Issue date Dec 18, 2012
- Hitachi, Ltd.
- Shiano Ono
- G01 - MEASURING TESTING
Information Patent Grant
Electric charged particle beam microscope and microscopy
- Patent number 7,863,564
- Issue date Jan 4, 2011
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric charged particle beam microscopy and electric charged part...
- Patent number 7,633,064
- Issue date Dec 15, 2009
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electric charged particle beam microscopy, electric charged particl...
- Patent number 7,372,051
- Issue date May 13, 2008
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- G01 - MEASURING TESTING
Information Patent Grant
Scanning transmission electron microscope and scanning transmission...
- Patent number 7,372,029
- Issue date May 13, 2008
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope and scanning transmission...
- Patent number 7,227,144
- Issue date Jun 5, 2007
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection instrument and positron beam apparatus
- Patent number 7,141,790
- Issue date Nov 28, 2006
- Hitachi, Ltd.
- Masanari Koguchi
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 6,888,139
- Issue date May 3, 2005
- Hitachi, Ltd.
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for charged particle beam microscopy
- Patent number 6,838,667
- Issue date Jan 4, 2005
- Hitachi, Ltd.
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Autoadjusting electron microscope
- Patent number 6,570,156
- Issue date May 27, 2003
- Hitachi, Ltd.
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 6,051,834
- Issue date Apr 18, 2000
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 5,866,905
- Issue date Feb 2, 1999
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 5,650,621
- Issue date Jul 22, 1997
- Hitachi, Ltd.
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope for specimen composition and strain analysis an...
- Patent number 5,453,617
- Issue date Sep 26, 1995
- Hitachi, Ltd.
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR ESTIMATING SHAPE BEFORE SHRINK AND CD-SEM APPARATUS
- Publication number 20150036914
- Publication date Feb 5, 2015
- Hitachi High-Technologies Corporation
- Tomoko Sekiguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM MICROSCOPE, SAMPLE HOLDER FOR CHARGED PARTICL...
- Publication number 20140353500
- Publication date Dec 4, 2014
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM MICROSCOPE AND METHOD OF MEASUREMENT EMPLOYIN...
- Publication number 20120287258
- Publication date Nov 15, 2012
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM MICROSCOPE AND MEASURING METHOD USING SAME
- Publication number 20120104253
- Publication date May 3, 2012
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRIC CHARGED PARTICLE BEAM MICROSCOPE AND MICROSCOPY
- Publication number 20090127474
- Publication date May 21, 2009
- Ruriko TSUNETA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope
- Publication number 20080283748
- Publication date Nov 20, 2008
- Hitachi High-Technologies Corporation
- Takao Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRIC CHARGED PARTICLE BEAM MICROSCOPY AND ELECTRIC CHARGED PART...
- Publication number 20080093551
- Publication date Apr 24, 2008
- Ruriko TSUNETA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Specimen Analyzing Apparatus and Specimen Holder
- Publication number 20080067374
- Publication date Mar 20, 2008
- Shiano Ono
- G01 - MEASURING TESTING
Information Patent Application
Specified position identifying method and specified position measur...
- Publication number 20070274593
- Publication date Nov 29, 2007
- Ruriko Tsuneta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scanning transmission electron microscope and scanning transmission...
- Publication number 20070228277
- Publication date Oct 4, 2007
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning transmission electron microscope and scanning transmission...
- Publication number 20060151701
- Publication date Jul 13, 2006
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electric charged particle beam microscopy, electric charged particl...
- Publication number 20060038125
- Publication date Feb 23, 2006
- Ruriko Tsuneta
- G01 - MEASURING TESTING
Information Patent Application
Defect inspection instrument and positron beam apparatus
- Publication number 20040227078
- Publication date Nov 18, 2004
- Masanari Koguchi
- G01 - MEASURING TESTING
Information Patent Application
Electron microscope
- Publication number 20030201393
- Publication date Oct 30, 2003
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Network solution system of analysis and evaluation
- Publication number 20020099573
- Publication date Jul 25, 2002
- Hitachi, Ltd.
- Masanari Koguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for charged particle beam microscopy
- Publication number 20020056808
- Publication date May 16, 2002
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS

Ruriko Tsuneta

Person

Patents Grantslast 30 patents

Method for estimating shape before shrink and CD-SEM apparatus

Electric charged particle beam microscope and electric charged part...

Charged particle beam microscope, sample holder for charged particl...

Specified position identifying method and specified position measur...

Multi-part specimen holder with conductive patterns

Electric charged particle beam microscope and microscopy

Electric charged particle beam microscopy and electric charged part...

Electric charged particle beam microscopy, electric charged particl...

Scanning transmission electron microscope and scanning transmission...

Scanning transmission electron microscope and scanning transmission...

Defect inspection instrument and positron beam apparatus

Electron microscope

Method and apparatus for charged particle beam microscopy

Autoadjusting electron microscope

Electron microscope

Electron microscope

Electron microscope

Electron microscope for specimen composition and strain analysis an...

Patents Applicationslast 30 patents

METHOD FOR ESTIMATING SHAPE BEFORE SHRINK AND CD-SEM APPARATUS

CHARGED PARTICLE BEAM MICROSCOPE, SAMPLE HOLDER FOR CHARGED PARTICL...

CHARGED PARTICLE BEAM MICROSCOPE AND METHOD OF MEASUREMENT EMPLOYIN...

CHARGED PARTICLE BEAM MICROSCOPE AND MEASURING METHOD USING SAME

ELECTRIC CHARGED PARTICLE BEAM MICROSCOPE AND MICROSCOPY

Electron microscope

ELECTRIC CHARGED PARTICLE BEAM MICROSCOPY AND ELECTRIC CHARGED PART...

Specimen Analyzing Apparatus and Specimen Holder

Specified position identifying method and specified position measur...

Scanning transmission electron microscope and scanning transmission...

Scanning transmission electron microscope and scanning transmission...

Electric charged particle beam microscopy, electric charged particl...

Defect inspection instrument and positron beam apparatus

Electron microscope

Network solution system of analysis and evaluation

Method and apparatus for charged particle beam microscopy