Ruslan Temirov

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Koeln, DE

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope and method for measuring local electrical...
- Patent number 10,585,116
- Issue date Mar 10, 2020
- Forschungszentrum Juelich GmbH
- Frank Stefan Tautz
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the force interaction that is caused by a sample
- Patent number 8,832,860
- Issue date Sep 9, 2014
- Forschungszentrum Juelich GmbH
- Ruslan Temirov
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for examining a sample
- Patent number 8,347,410
- Issue date Jan 1, 2013
- Forschungszentrum Juelich GmbH
- Ruslan Temirov
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE AND METHOD FOR MEASURING LOCAL ELECTRICAL...
- Publication number 20180024161
- Publication date Jan 25, 2018
- FORSCHUNGSZENTRUM JUELICH GMBH
- Frank Stefan Tautz
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING THE FORCE INTERACTION THAT IS CAUSED BY A SAMPLE
- Publication number 20120151638
- Publication date Jun 14, 2012
- Ruslan Temirov
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EXAMINING A SAMPLE
- Publication number 20100263097
- Publication date Oct 14, 2010
- Ruslan Temirov
- G01 - MEASURING TESTING