Williamsburg, VA, US
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Patent Grant
The United States of America as represented by the Administrator of NASA
Russell A. Wincheski
B82 - NANO-TECHNOLOGY
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Patent Grant
The United States of America as respresented by the United States National Ae...
Russell A. Wincheski
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Russell A. Wincheski
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Jan M. Smits
B82 - NANO-TECHNOLOGY
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Jan M. Smits
B82 - NANO-TECHNOLOGY
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Patent Grant
United States of America as represented by the Administrator of the National...
Jan M. Smits
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Russell A. Wincheski
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Russell A. Wincheski
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Robert G. Bryant
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Robert G. Bryant
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Russell A. Wincheski
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the administrator of the Natio...
James P. Fulton
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the administrator of the Natio...
John W. Simpson
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Russell A. Wincheski
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the United States National Aer...
John W. Simpson
G01 - MEASURING TESTING
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Patent Application
U.S.A. as represented by the Administrator of the National Aeronautics and Sp...
Russell A. Wincheski
G01 - MEASURING TESTING
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Patent Application
Jae-Woo Kim
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
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Patent Application
USA as represented by the Administrator of the National Aeronautics and Space...
Russell A. Wincheski
G01 - MEASURING TESTING
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Patent Application
United States of America as represented by the Administrator of the National...
Russell A. Wincheski
G01 - MEASURING TESTING
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Patent Application
USA as represented by the Administrator of the National Aeronautics and Space...
Jan M. Smits
B82 - NANO-TECHNOLOGY
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Patent Application
USA as represented by the Administrator of the National Aeronautics and Space...
Jan M. Smits
G01 - MEASURING TESTING
Information
Patent Application
USA as represented by the Administrator of the National Aeronautics and Space...
Russell A. Wincheski
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
United States of America as represented by the Admin. of the Nat'l Aeronautic...
Jan M. Smits
B82 - NANO-TECHNOLOGY
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Patent Application
National Aeronautics & Space Administration
Russell A. Wincheski
G01 - MEASURING TESTING
