Russell F. Oberg

Person

Beldenville, WI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electrically conductive pins for microcircuit tester
- Patent number 10,877,090
- Issue date Dec 29, 2020
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic seed sensor assembly for seed tube planting applica...
- Patent number 9,863,894
- Issue date Jan 9, 2018
- TSI, Incorporated
- Amit V. Itagi
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic seed sensor assembly for seed tube planting applica...
- Patent number 9,557,278
- Issue date Jan 31, 2017
- TSI Incorporated
- Amit V. Itagi
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins for microcircuit tester
- Patent number 9,007,082
- Issue date Apr 14, 2015
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Microcircuit tester with slideable electrically conductive pins
- Patent number 8,937,484
- Issue date Jan 20, 2015
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Test contact system for testing integrated circuits with packages h...
- Patent number 8,912,811
- Issue date Dec 16, 2014
- Johnstech International Corporation
- Jeffrey C. Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins for microcircuit tester
- Patent number 8,536,889
- Issue date Sep 17, 2013
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Electrical contact pin
- Patent number D663635
- Issue date Jul 17, 2012
- Johnstech International Corporation
- John E. Steger
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Test contact system for testing integrated circuits with packages h...
- Patent number 8,102,184
- Issue date Jan 24, 2012
- Johnstech International
- Jeffrey C. Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Electrical pin used in integrated circuit test sockets
- Patent number D634228
- Issue date Mar 15, 2011
- Johnstech International
- John E. Steger
- D10 - Measuring, testing, or signalling instruments

Patents Applicationslast 30 patents

Information Patent Application
WIRELESS DISTRIBUTED SENSING
- Publication number 20240267065
- Publication date Aug 8, 2024
- Jerry Bark
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20170315169
- Publication date Nov 2, 2017
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20150123689
- Publication date May 7, 2015
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20130271176
- Publication date Oct 17, 2013
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20130154678
- Publication date Jun 20, 2013
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Test Contact System For Testing Integrated Circuits With Packages H...
- Publication number 20120176151
- Publication date Jul 12, 2012
- Johnstech International Corporation
- Jeffrey C. Sherry
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20120062261
- Publication date Mar 15, 2012
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20100231251
- Publication date Sep 16, 2010
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Test Contact System For Testing Integrated Circuits With Packages H...
- Publication number 20090302878
- Publication date Dec 10, 2009
- Jeffrey C. Sherry
- G01 - MEASURING TESTING

Russell F. Oberg

Person

Patents Grantslast 30 patents

Electrically conductive pins for microcircuit tester

Electromagnetic seed sensor assembly for seed tube planting applica...

Electromagnetic seed sensor assembly for seed tube planting applica...

Electrically conductive pins for microcircuit tester

Microcircuit tester with slideable electrically conductive pins

Test contact system for testing integrated circuits with packages h...

Electrically conductive pins for microcircuit tester

Electrical contact pin

Test contact system for testing integrated circuits with packages h...

Electrical pin used in integrated circuit test sockets

Patents Applicationslast 30 patents

WIRELESS DISTRIBUTED SENSING

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Test Contact System For Testing Integrated Circuits With Packages H...

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Test Contact System For Testing Integrated Circuits With Packages H...