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Russell G. Schonberg
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Los Altos Hills, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Systems and methods for using an intensity-modulated X-ray source
Patent number
8,781,067
Issue date
Jul 15, 2014
Rapiscan Systems, Inc.
Willem G. J. Langeveld
G01 - MEASURING TESTING
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Patent Grant
Systems and methods for using an intensity-modulated X-ray source
Patent number
8,437,448
Issue date
May 7, 2013
Rapiscan Systems, Inc.
Willem G. J. Langeveld
G01 - MEASURING TESTING
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Patent Grant
Systems and methods for using an intensity-modulated X-ray source
Patent number
8,054,937
Issue date
Nov 8, 2011
Rapiscan Systems, Inc.
Willem G. J. Langeveld
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Systems and Methods for Using an Intensity-Modulated X-Ray Source
Publication number
20130329855
Publication date
Dec 12, 2013
Rapiscan Systems, Inc.
Willem G.J. Langeveld
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR USING AN INTENSITY-MODULATED X-RAY SOURCE
Publication number
20120257719
Publication date
Oct 11, 2012
Willem G.J. Langeveld
G01 - MEASURING TESTING
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Patent Application
Systems and Methods for Using An Intensity-Modulated X-Ray Source
Publication number
20100034355
Publication date
Feb 11, 2010
Willem G.J. Langeveld
G01 - MEASURING TESTING