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Ruwan T. Kurulugama
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Santa Clara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Wideband isolation directed by ion mobility separation for analyzin...
Patent number
10,267,765
Issue date
Apr 23, 2019
Agilent Technologies, Inc.
Jun Wang
G01 - MEASURING TESTING
Information
Patent Grant
Automatic determination of demultiplexing matrix for ion mobility s...
Patent number
10,037,873
Issue date
Jul 31, 2018
Agilent Technologies, Inc.
Jun Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
In-source collision-induced heating and activation of gas-phase ion...
Patent number
9,916,968
Issue date
Mar 13, 2018
Agilent Technologies, Inc.
Ruwan T. Kurulugama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fast method for measuring collision cross section of ions utilizing...
Patent number
9,482,642
Issue date
Nov 1, 2016
Agilent Technologies, Inc.
Alexander Mordehai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion mobility spectrometry-mass spectrometry (IMS-MS) with improved...
Patent number
9,455,132
Issue date
Sep 27, 2016
Agilent Technologies, Inc.
Alexander Mordehai
G01 - MEASURING TESTING
Information
Patent Grant
Ion processing utilizing segmented vacuum manifold
Patent number
9,281,173
Issue date
Mar 8, 2016
Agilent Technologies, Inc.
Alexander Mordehai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ION ACTIVATION AND FRAGMENTATION IN SUB-AMBIENT PRESSURE FOR ION MO...
Publication number
20230126290
Publication date
Apr 27, 2023
Agilent Technologies, Inc.
Ruwan T. KURULUGAMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IN-SOURCE COLLISION-INDUCED HEATING AND ACTIVATION OF GAS-PHASE ION...
Publication number
20180053640
Publication date
Feb 22, 2018
Agilent Technologies, Inc.
Ruwan T. Kurulugama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WIDEBAND ISOLATION DIRECTED BY ION MOBILITY SEPARATION FOR ANALYZIN...
Publication number
20170299550
Publication date
Oct 19, 2017
Agilent Technologies, Inc.
Jun Wang
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC DETERMINATION OF DEMULTIPLEXING MATRIX FOR ION MOBILITY S...
Publication number
20160172171
Publication date
Jun 16, 2016
Agilent Technologies, Inc.
Jun Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FAST METHOD FOR MEASURING COLLISION CROSS SECTION OF IONS UTILIZING...
Publication number
20150219598
Publication date
Aug 6, 2015
Agilent Technologies, Inc.
Alexander Mordehai
G01 - MEASURING TESTING
Information
Patent Application
ION PROCESSING UTILIZING SEGMENTED VACUUM MANIFOLD
Publication number
20140353483
Publication date
Dec 4, 2014
Alexander Mordehai
G01 - MEASURING TESTING
Information
Patent Application
ION MOBILITY SPECTROMETRY-MASS SPECTROMETRY (IMS-MS) WITH IMPROVED...
Publication number
20140353493
Publication date
Dec 4, 2014
Alexander Mordehai
G01 - MEASURING TESTING