Ryan Major

Person

Crystal, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 12,140,571
- Issue date Nov 12, 2024
- Bruker Nano, Inc.
- Edward Cyrankowski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 11,237,087
- Issue date Feb 1, 2022
- Bruker Nano, Inc.
- Edward Cyrankowski
- G01 - MEASURING TESTING
Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 10,663,380
- Issue date May 26, 2020
- Bruker Nano, Inc.
- Edward Cyrankowski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
High temperature heating system
- Patent number 10,241,017
- Issue date Mar 26, 2019
- Bruker Nano, Inc.
- Lucas Paul Keranen
- G01 - MEASURING TESTING
Information Patent Grant
Environmental conditioning assembly for use in mechanical testing a...
- Patent number 9,829,417
- Issue date Nov 28, 2017
- Hysitron, Inc.
- Roger William Schmitz
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
High temperature heating system
- Patent number 9,804,072
- Issue date Oct 31, 2017
- Hysitron, Inc.
- Syed Amanulla Syed Asif
- G01 - MEASURING TESTING
Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 9,472,374
- Issue date Oct 18, 2016
- Hysitron, Inc.
- Edward Cyrankowski
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring an interaction force
- Patent number 9,335,240
- Issue date May 10, 2016
- Hysitron Incorporated
- Yunje Oh
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Three dimensional transducer
- Patent number 8,844,366
- Issue date Sep 30, 2014
- Hysitron, Inc.
- Oden Lee Warren
- G01 - MEASURING TESTING
Information Patent Grant
Digital damping control of nanomechanical test instruments
- Patent number 8,738,315
- Issue date May 27, 2014
- Hysitron Incorporated
- Yunje Oh
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20220357251
- Publication date Nov 10, 2022
- Bruker Nano, Inc.
- Edward Cyrankowski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20200408655
- Publication date Dec 31, 2020
- Bruker Nano, Inc.
- Edward Cyrankowski
- G01 - MEASURING TESTING
Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20170030812
- Publication date Feb 2, 2017
- HYSITRON, INC.
- Edward Cyrankowski
- G02 - OPTICS
Information Patent Application
ENVIRONMENTAL CONDITIONING ASSEMBLY FOR USE IN MECHANICAL TESTING A...
- Publication number 20150185117
- Publication date Jul 2, 2015
- HYSITRON, INC.
- Roger William Schmitz
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
MICROSCOPE OBJECTIVE MECHANICAL TESTING INSTRUMENT
- Publication number 20150075264
- Publication date Mar 19, 2015
- HYSITRON, INC.
- Syed Amanulla Syed Asif
- G02 - OPTICS
Information Patent Application
HIGH TEMPERATURE HEATING SYSTEM
- Publication number 20150033835
- Publication date Feb 5, 2015
- HYSITRON, INC.
- Syed Amanulla Syed Asif
- G01 - MEASURING TESTING
Information Patent Application
HIGH TEMPERATURE HEATING SYSTEM
- Publication number 20140331782
- Publication date Nov 13, 2014
- Lucas Paul Keranen
- G01 - MEASURING TESTING
Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20140231670
- Publication date Aug 21, 2014
- HYSITRON, INC.
- Edward Cyrankowski
- G02 - OPTICS
Information Patent Application
THREE DIMENSIONAL TRANSDUCER
- Publication number 20140150562
- Publication date Jun 5, 2014
- HYSITRON, INC.
- Oden Lee Warren
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING AN INTERACTION FORCE
- Publication number 20130098145
- Publication date Apr 25, 2013
- HYSITRON INCORPORATED
- Yunje Oh
- B82 - NANO-TECHNOLOGY
Information Patent Application
DIGITAL DAMPING CONTROL OF NANOMECHANICAL TEST INSTRUMENTS
- Publication number 20100036636
- Publication date Feb 11, 2010
- Hysitron Incorporated
- Yunje Oh
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Testing assembly including a multiple degree of freedom stage

Testing assembly including a multiple degree of freedom stage

Testing assembly including a multiple degree of freedom stage

High temperature heating system

Environmental conditioning assembly for use in mechanical testing a...

High temperature heating system

Testing assembly including a multiple degree of freedom stage

Method of measuring an interaction force

Three dimensional transducer

Digital damping control of nanomechanical test instruments

Patents Applicationslast 30 patents

TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE

TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE

TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE

ENVIRONMENTAL CONDITIONING ASSEMBLY FOR USE IN MECHANICAL TESTING A...

MICROSCOPE OBJECTIVE MECHANICAL TESTING INSTRUMENT

HIGH TEMPERATURE HEATING SYSTEM

HIGH TEMPERATURE HEATING SYSTEM

TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE

THREE DIMENSIONAL TRANSDUCER

METHOD OF MEASURING AN INTERACTION FORCE

DIGITAL DAMPING CONTROL OF NANOMECHANICAL TEST INSTRUMENTS