Ryan Tsai

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Local purge within metrology and inspection systems
- Patent number 10,451,542
- Issue date Oct 22, 2019
- Nanometrics Incorporated
- Paul A. Doyle
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LOCAL PURGE WITHIN METROLOGY AND INSPECTION SYSTEMS
- Publication number 20200011786
- Publication date Jan 9, 2020
- Nanometrics Incorporated
- Paul A. DOYLE
- G01 - MEASURING TESTING
Information Patent Application
LOCAL PURGE WITHIN METROLOGY AND INSPECTION SYSTEMS
- Publication number 20190170634
- Publication date Jun 6, 2019
- Nanometrics Incorporated
- Paul A. DOYLE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY