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Ryan Wenzel
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Zurich, CH
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last 30 patents
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Patent Grant
Detector device for high mass ion detection, a method for analyzing...
Patent number
8,487,242
Issue date
Jul 16, 2013
Covalx AG
Ryan Wenzel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometric analysis method
Patent number
8,323,983
Issue date
Dec 4, 2012
Eidgenossische Technische Hochschule Zurich
Alexis Nazabal
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
DETECTOR DEVICE FOR HIGH MASS ION DETECTION, A METHOD FOR ANALYZING...
Publication number
20110001043
Publication date
Jan 6, 2011
COVALX AG
Ryan Wenzel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass spectrometric analysis method
Publication number
20090263786
Publication date
Oct 22, 2009
Alexis Nazabal
G01 - MEASURING TESTING