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Probe card
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Patent number 9,476,913
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Issue date Oct 25, 2016
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Shinko Electric Industries Co., Ltd.
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Ryo Fukasawa
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G01 - MEASURING TESTING
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Probe card
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Patent number 9,470,718
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Issue date Oct 18, 2016
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Shinko Electric Industries Co., Ltd.
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Ryo Fukasawa
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G01 - MEASURING TESTING
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Stacked electronic device
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Patent number 9,373,587
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Issue date Jun 21, 2016
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Shinko Electric Industries Co., Ltd.
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Michio Horiuchi
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H01 - BASIC ELECTRIC ELEMENTS
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Fuel cell
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Patent number 7,169,501
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Issue date Jan 30, 2007
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Shinko Electric Industries Co., Ltd.
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Shigeaki Suganuma
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Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...