Ryo KADOI

Person

Fujisawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Power supply module and charged particle beam device
- Patent number 12,132,411
- Issue date Oct 29, 2024
- HITACHI HIGH-TECH CORPORATION
- Ryo Kadoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and method of measuring electrical noise
- Patent number 11,735,395
- Issue date Aug 22, 2023
- HITACHI HIGH-TECH CORPORATION
- Takayasu Iwatsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,694,871
- Issue date Jul 4, 2023
- HITACHI HIGH-TECH CORPORATION
- Ryo Kadoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power converter and control method of power converter that reduce r...
- Patent number 11,671,007
- Issue date Jun 6, 2023
- Hitachi, Ltd.
- Akio Yamamoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Medium sensor device and monitoring system
- Patent number 11,199,511
- Issue date Dec 14, 2021
- Hitachi, Ltd.
- Kazuki Ikeda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Charged particle beam system
- Patent number 11,017,981
- Issue date May 25, 2021
- HITACHI HIGH-TECH CORPORATION
- Ryo Kadoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,973,112
- Issue date Apr 6, 2021
- HITACHI HIGH-TECH CORPORATION
- Ryo Kadoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device with transient signal correction durin...
- Patent number 10,559,447
- Issue date Feb 11, 2020
- Hitachi High-Technologies Corporation
- Ryo Kadoi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 10,424,459
- Issue date Sep 24, 2019
- Hitachi High-Technologies Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,679,740
- Issue date Jun 13, 2017
- Hitachi High-Technologies Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and image generation method
- Patent number 9,478,392
- Issue date Oct 25, 2016
- Hitachi High-Technologies Corporation
- Kazuki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switch circuit, mass spectrometer, and control method for switch ci...
- Patent number 9,337,822
- Issue date May 10, 2016
- Hitachi High-Technologies Corporation
- Ryo Kadoi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Processing apparatus and method using a scanning electron microscope
- Patent number 9,177,759
- Issue date Nov 3, 2015
- Hitachi High-Technologies Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High frequency module and portable terminal using same
- Patent number 9,166,542
- Issue date Oct 20, 2015
- Murata Manufacturing Co., Ltd.
- Norio Hayashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
High frequency circuit and high frequency module
- Patent number 8,810,317
- Issue date Aug 19, 2014
- Renesas Electronics Corporation
- Ryo Kadoi
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Power Supply Module and Charged Particle Beam Device
- Publication number 20220319795
- Publication date Oct 6, 2022
- Hitachi High-Tech Corporation
- Ryo Kadoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220059312
- Publication date Feb 24, 2022
- HITACHI HIGH-TECH CORPORATION
- Ryo Kadoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD OF MEASURING ELECTRICAL NOISE
- Publication number 20220037109
- Publication date Feb 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Takayasu Iwatsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEDIUM SENSOR DEVICE AND MONITORING SYSTEM
- Publication number 20210109037
- Publication date Apr 15, 2021
- Hitachi, Ltd
- Kazuki IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER CONVERTER AND CONTROL METHOD OF POWER CONVERTER
- Publication number 20210099095
- Publication date Apr 1, 2021
- Hitachi, Ltd
- Akio YAMAMOTO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20200221566
- Publication date Jul 9, 2020
- Hitachi High-Technologies Corporation
- Ryo KADOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM
- Publication number 20200090900
- Publication date Mar 19, 2020
- Hitachi High-Technologies Corporation
- Ryo KADOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20180106610
- Publication date Apr 19, 2018
- Hitachi High-Technologies Corporation
- Ryo KADOI
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20170271121
- Publication date Sep 21, 2017
- Hitachi High-Technologies Corporation
- Wen LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20160329186
- Publication date Nov 10, 2016
- Hitachi High-Technologies Corporation
- Wen LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND IMAGE GENERATION METHOD
- Publication number 20160064182
- Publication date Mar 3, 2016
- Hitachi High-Technologies Corporation
- Kazuki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCH CIRCUIT, MASS SPECTROMETER, AND CONTROL METHOD FOR SWITCH CI...
- Publication number 20150108340
- Publication date Apr 23, 2015
- Hitachi High-Technologies Corporation
- Ryo Kadoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESSING APPARATUS AND METHOD USING A SCANNING ELECTRON MICROSCOPE
- Publication number 20150041643
- Publication date Feb 12, 2015
- Hitachi High-Technologies Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH FREQUENCY MODULE AND PORTABLE TERMINAL USING SAME
- Publication number 20140354360
- Publication date Dec 4, 2014
- Norio Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH FREQUENCY CIRCUIT AND HIGH FREQUENCY MODULE
- Publication number 20130033327
- Publication date Feb 7, 2013
- RENESAS ELECTRONICS CORPORATION
- Ryo KADOI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TRANSMITTER
- Publication number 20110269416
- Publication date Nov 3, 2011
- Renesas Electronics Corporation
- Ryo Kadoi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
WIRELESS COMMUNICATION SYSTEM
- Publication number 20110064023
- Publication date Mar 17, 2011
- Akio YAMAMOTO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Person

Patents Grantslast 30 patents

Power supply module and charged particle beam device

Charged particle beam device and method of measuring electrical noise

Charged particle beam device

Power converter and control method of power converter that reduce r...

Medium sensor device and monitoring system

Charged particle beam system

Charged particle beam device

Charged particle beam device with transient signal correction durin...

Charged particle beam device

Charged particle beam device

Charged particle beam apparatus and image generation method

Switch circuit, mass spectrometer, and control method for switch ci...

Processing apparatus and method using a scanning electron microscope

High frequency module and portable terminal using same

High frequency circuit and high frequency module

Patents Applicationslast 30 patents

Power Supply Module and Charged Particle Beam Device

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE AND METHOD OF MEASURING ELECTRICAL NOISE

MEDIUM SENSOR DEVICE AND MONITORING SYSTEM

POWER CONVERTER AND CONTROL METHOD OF POWER CONVERTER

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM SYSTEM

CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam Device

Charged Particle Beam Device

CHARGED PARTICLE BEAM APPARATUS AND IMAGE GENERATION METHOD

SWITCH CIRCUIT, MASS SPECTROMETER, AND CONTROL METHOD FOR SWITCH CI...

PROCESSING APPARATUS AND METHOD USING A SCANNING ELECTRON MICROSCOPE

HIGH FREQUENCY MODULE AND PORTABLE TERMINAL USING SAME

HIGH FREQUENCY CIRCUIT AND HIGH FREQUENCY MODULE

TRANSMITTER

WIRELESS COMMUNICATION SYSTEM