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Ryo SHIMODA

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  • Yokohama, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Pattern defect detection method
    • Patent number 10,802,073
    • Issue date Oct 13, 2020
    • TASMIT, INC.
    • Ryo Shimoda
    • G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PATTERN DEFECT DETECTION METHOD
    • Publication number 20190025371
    • Publication date Jan 24, 2019
    • NGR Inc.
    • Ryo SHIMODA
    • G06 - COMPUTING CALCULATING COUNTING