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Ryo Ujike

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  • Yokohama-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Manufacturing method for probe contact
    • Patent number 8,312,626
    • Issue date Nov 20, 2012
    • Yamaichi Electronics Co., Ltd.
    • Takeyuki Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method for assembling testing equipment for semiconductor substrate
    • Patent number 7,908,747
    • Issue date Mar 22, 2011
    • Yamaichi Electronics Co., Ltd.
    • Takeyuki Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Socket for semiconductor device
    • Patent number 7,278,868
    • Issue date Oct 9, 2007
    • Yamaichi Electronics Co., Ltd.
    • Masaru Sato
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device socket
    • Patent number 7,230,830
    • Issue date Jun 12, 2007
    • Yamaichi Electronics Co., Ltd.
    • Ryo Ujike
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Socket for semiconductor device
    • Patent number 7,204,708
    • Issue date Apr 17, 2007
    • Yamaichi Electronics Co., Ltd.
    • Masaru Sato
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Socket for semiconductor device
    • Patent number 7,165,978
    • Issue date Jan 23, 2007
    • Yamichi Electronics Co., Ltd.
    • Masaru Sato
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Socket for semiconductor device
    • Patent number 7,118,386
    • Issue date Oct 10, 2006
    • Yamaichi Electronics Co., Ltd.
    • Masaru Sato
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Socket for electronic element
    • Patent number 6,796,823
    • Issue date Sep 28, 2004
    • Yamaichi Electronics Co., Ltd.
    • Kazunori Nakano
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor device-socket
    • Patent number 6,655,974
    • Issue date Dec 2, 2003
    • Yamaichi Electronics Co., Ltd.
    • Kazunori Nakano
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Socket for electronic element
    • Patent number 6,540,538
    • Issue date Apr 1, 2003
    • Yamaichi Electronics Co., Ltd.
    • Kazunori Nakano
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    MANUFACTURING METHOD FOR PROBE CONTACT
    • Publication number 20100050431
    • Publication date Mar 4, 2010
    • Yamaichi Electronics Co., Ltd.
    • Takeyuki Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Method for assembling testing equipment for semiconductor substrate
    • Publication number 20060240581
    • Publication date Oct 26, 2006
    • Yamaichi Electronics Co., Ltd.
    • Takeyuki Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Socket for semiconductor device
    • Publication number 20060228915
    • Publication date Oct 12, 2006
    • Yamaichi Electronics Co., Ltd.
    • Masaru Sato
    • G01 - MEASURING TESTING
  • Information Patent Application

    Socket for semiconductor device
    • Publication number 20060228926
    • Publication date Oct 12, 2006
    • Yamaichi Electronics Co., Ltd.
    • Masaru Sato
    • G01 - MEASURING TESTING
  • Information Patent Application

    Socket for semiconductor device
    • Publication number 20060228916
    • Publication date Oct 12, 2006
    • Yamaichi Electronics Co., Ltd.
    • Masaru Sato
    • G01 - MEASURING TESTING
  • Information Patent Application

    Semiconductor device socket
    • Publication number 20050231919
    • Publication date Oct 20, 2005
    • Yamaichi Electronics Co., Ltd.
    • Ryo Ujike
    • G01 - MEASURING TESTING
  • Information Patent Application

    Socket for semiconductor device
    • Publication number 20040248435
    • Publication date Dec 9, 2004
    • Yamaichi Electronics Co., Ltd.
    • Masaru Sato
    • G01 - MEASURING TESTING
  • Information Patent Application

    Semiconductor device-socket
    • Publication number 20020177344
    • Publication date Nov 28, 2002
    • Yamaichi Electronics Co., Ltd.
    • Kazunori Nakano
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    Socket for electronic element
    • Publication number 20020173174
    • Publication date Nov 21, 2002
    • Yamaichi Electronics Co., Ltd.
    • Kazunori Nakano
    • H01 - BASIC ELECTRIC ELEMENTS