Ryohei Kokawa

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Hadano, JP

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Patents Grantslast 30 patents

Information Patent Grant
Cantilever attachment fitting and scanning probe microscope provide...
- Patent number 10,620,235
- Issue date Apr 14, 2020
- Shimadzu Corporation
- Ryohei Kokawa
- G01 - MEASURING TESTING
Information Patent Grant
Micro-material testing apparatus
- Patent number 6,532,805
- Issue date Mar 18, 2003
- Shimadzu Corporation
- Ryohei Kokawa
- G01 - MEASURING TESTING
Information Patent Grant
Film inspecting apparatus
- Patent number 6,137,115
- Issue date Oct 24, 2000
- Shimadzu Corporation
- Ryohei Kokawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Environment controllable scanning probe microscope
- Patent number 5,200,616
- Issue date Apr 6, 1993
- Shimadzu Corporation
- Ryohei Kokawa
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
CANTILEVER ATTACHMENT FITTING AND SCANNING PROBE MICROSCOPE PROVIDE...
- Publication number 20160245844
- Publication date Aug 25, 2016
- SHIMADZU CORPORATION
- Ryohei KOKAWA
- G01 - MEASURING TESTING