Ryohei Tanaka

Person

Takarazuka-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for evaluating reliability of electrical power measuring device
- Patent number 9,372,248
- Issue date Jun 21, 2016
- Daihen Corporation
- Ryohei Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
High frequency measurement apparatus and calibration method for hig...
- Patent number 8,738,314
- Issue date May 27, 2014
- Daihen Corporation
- Ryohei Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency measuring device and high-frequency measuring device...
- Patent number 8,686,711
- Issue date Apr 1, 2014
- Daihen Corporation
- Ryohei Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-frequency measuring device and high-frequency measuring device...
- Patent number 8,510,071
- Issue date Aug 13, 2013
- Daihen Corporation
- Ryohei Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
High frequency device with variable frequency and variable load imp...
- Patent number 8,203,859
- Issue date Jun 19, 2012
- Daihen Corporation
- Shuji Omae
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arc detector for plasma processing system
- Patent number 7,915,563
- Issue date Mar 29, 2011
- Daihen Corporation
- Ryohei Tanaka
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Signal processing device for computing phase difference between alt...
- Patent number 7,702,702
- Issue date Apr 20, 2010
- Daihen Corporation
- Ryohei Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive digital filter
- Patent number 7,492,817
- Issue date Feb 17, 2009
- Daihen Corporation
- Ryohei Tanaka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
High-frequency power device and method for controlling high-frequen...
- Patent number 7,489,206
- Issue date Feb 10, 2009
- Daihen Corporation
- Hiroyuki Kotani
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Plasma processing system
- Patent number 7,489,145
- Issue date Feb 10, 2009
- Daihen Corporation
- Hiroshi Matoba
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High-frequency power source
- Patent number 7,292,047
- Issue date Nov 6, 2007
- Daihen Corporation
- Ryohei Tanaka
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Logic integrated circuit, and recording medium readable by a comput...
- Patent number 6,928,532
- Issue date Aug 9, 2005
- Roran Co.
- Kenji Shigeki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Channel separating filter apparatus, PSK demodulator apparatus and...
- Patent number 5,999,575
- Issue date Dec 7, 1999
- Daihen Corporation
- Ryohei Tanaka
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical vehicle detection system
- Patent number 4,433,325
- Issue date Feb 21, 1984
- Omron Tateisi Electronics, Co.
- Ryohei Tanaka
- G08 - SIGNALLING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR EVALUATING RELIABILITY OF ELECTRICAL POWER MEASURING DEVICE
- Publication number 20160282440
- Publication date Sep 29, 2016
- DAIHEN Corporation
- Ryohei TANAKA
- G01 - MEASURING TESTING
Information Patent Application
HIGH FREQUENCY MEASUREMENT APPARATUS AND CALIBRATION METHOD FOR HIG...
- Publication number 20120084037
- Publication date Apr 5, 2012
- DAIHEN Corporation
- Ryohei TANAKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING RELIABILITY OF ELECTRICAL POWER MEASURING DEVICE
- Publication number 20110238360
- Publication date Sep 29, 2011
- DAIHEN Corporation
- Ryohei TANAKA
- G01 - MEASURING TESTING
Information Patent Application
HIGH-FREQUENCY MEASURING DEVICE AND HIGH-FREQUENCY MEASURING DEVICE...
- Publication number 20110238356
- Publication date Sep 29, 2011
- DAIHEN Corporation
- Ryohei TANAKA
- G01 - MEASURING TESTING
Information Patent Application
HIGH-FREQUENCY MEASURING DEVICE AND HIGH-FREQUENCY MEASURING DEVICE...
- Publication number 20110234201
- Publication date Sep 29, 2011
- DAIHEN Corporation
- Ryohei TANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH FREQUENCY DEVICE
- Publication number 20080158927
- Publication date Jul 3, 2008
- DAIHEN Corporation
- Shuji OMAE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Arc detector for plasma processing system
- Publication number 20080149603
- Publication date Jun 26, 2008
- DAIHEN CORPORATION
- Ryohei Tanaka
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Plasma processing system
- Publication number 20070152678
- Publication date Jul 5, 2007
- DAIHEN CORPORATION
- Hiroshi Matoba
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Signal processing device for computing phase difference between alt...
- Publication number 20060248138
- Publication date Nov 2, 2006
- DAIHEN CORPORATION
- Ryohei Tanaka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
High-frequency power device and method for controlling high-frequen...
- Publication number 20060220573
- Publication date Oct 5, 2006
- DAIHEN Corporation
- Hiroyuki Kotani
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
High-frequency power source
- Publication number 20060220656
- Publication date Oct 5, 2006
- DAIHEN CORPORATION
- Ryohei Tanaka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Adaptive digital filter
- Publication number 20050180497
- Publication date Aug 18, 2005
- DAIHEN CORPORATION
- Ryohei Tanaka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Signal processing apparatus, and voltage or current measurer utiliz...
- Publication number 20050171992
- Publication date Aug 4, 2005
- DAIHEN CORPORATION
- Ryohei Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Data-generating device and data-writing device for FPGA
- Publication number 20050069128
- Publication date Mar 31, 2005
- DAIHEN CORPORATION
- Takeshi Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Recording medium storing a program for constructing scan paths, sca...
- Publication number 20020010886
- Publication date Jan 24, 2002
- DAIHEN CORPORATION
- Ryohei Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Logic integrated circuit, and recording medium readable by a comput...
- Publication number 20010011345
- Publication date Aug 2, 2001
- (1) Roran Co. and (2) Daihen Corporation
- Kenji Shigeki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CPU core development support system, method for development support...
- Publication number 20010011214
- Publication date Aug 2, 2001
- (1) Roran Co. and (2) Daihen Corporation
- Kenji Shigeki
- G06 - COMPUTING CALCULATING COUNTING

Ryohei Tanaka

Person

Patents Grantslast 30 patents

Method for evaluating reliability of electrical power measuring device

High frequency measurement apparatus and calibration method for hig...

High-frequency measuring device and high-frequency measuring device...

High-frequency measuring device and high-frequency measuring device...

High frequency device with variable frequency and variable load imp...

Arc detector for plasma processing system

Signal processing device for computing phase difference between alt...

Adaptive digital filter

High-frequency power device and method for controlling high-frequen...

Plasma processing system

High-frequency power source

Logic integrated circuit, and recording medium readable by a comput...

Channel separating filter apparatus, PSK demodulator apparatus and...

Optical vehicle detection system

Patents Applicationslast 30 patents

METHOD FOR EVALUATING RELIABILITY OF ELECTRICAL POWER MEASURING DEVICE

HIGH FREQUENCY MEASUREMENT APPARATUS AND CALIBRATION METHOD FOR HIG...

METHOD FOR EVALUATING RELIABILITY OF ELECTRICAL POWER MEASURING DEVICE

HIGH-FREQUENCY MEASURING DEVICE AND HIGH-FREQUENCY MEASURING DEVICE...

HIGH-FREQUENCY MEASURING DEVICE AND HIGH-FREQUENCY MEASURING DEVICE...

HIGH FREQUENCY DEVICE

Arc detector for plasma processing system

Plasma processing system

Signal processing device for computing phase difference between alt...

High-frequency power device and method for controlling high-frequen...

High-frequency power source

Adaptive digital filter

Signal processing apparatus, and voltage or current measurer utiliz...

Data-generating device and data-writing device for FPGA

Recording medium storing a program for constructing scan paths, sca...

Logic integrated circuit, and recording medium readable by a comput...

CPU core development support system, method for development support...