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Ryoichi Ishii
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Hitachinaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Charged particle beam device
Patent number
8,933,422
Issue date
Jan 13, 2015
Hitachi High-Technologies Corporation
Ryoichi Ishii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus
Patent number
8,334,520
Issue date
Dec 18, 2012
Hitachi High-Technologies Corporation
Tadashi Otaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam trajectory corrector and charged particle bea...
Patent number
7,875,858
Issue date
Jan 25, 2011
Hitachi High-Technologies Corporation
Hiroyuki Ito
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Image forming method and electron microscope
Patent number
7,838,834
Issue date
Nov 23, 2010
Hitachi High-Technologies Corporation
Isao Nagaoki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Environmental scanning electron microcope
Patent number
7,365,323
Issue date
Apr 29, 2008
Hitachi High-Technologies Corporation
Tomohisa Ohtaki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE
Publication number
20130200271
Publication date
Aug 8, 2013
Hitachi High-Technologies Corporation
Ryoichi Ishii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS
Publication number
20110260057
Publication date
Oct 27, 2011
Tadashi Otaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM TRAJECTORY CORRECTOR AND CHARGED PARTICLE BEA...
Publication number
20090173887
Publication date
Jul 9, 2009
Hitachi High-Technologies Corporation
Hiroyuki ITO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Image Forming Method and Electron Microscope
Publication number
20080224040
Publication date
Sep 18, 2008
Hitachi High-Technologies Corporation
Isao Nagaoki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning Transmission Charged Particle Beam Device
Publication number
20080197282
Publication date
Aug 21, 2008
Hitachi High-Technologies Corporation
Yoshihiko Nakayama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Environmental scanning electron microscope
Publication number
20060219912
Publication date
Oct 5, 2006
Hitachi High-Technologies Corporation
Tomohisa Ohtaki
G01 - MEASURING TESTING