Ryoichi Kinoshita

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Thermal analysis system and method of drying the same
- Patent number 7,641,384
- Issue date Jan 5, 2010
- SII NanoTechnology Inc.
- Rintaro Nakatani
- G01 - MEASURING TESTING
Information Patent Grant
Heat flow flux type differential scanning calorimeter
- Patent number 7,588,366
- Issue date Sep 15, 2009
- SII NanoTechnology Inc.
- Ryoichi Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Differential scanning calorimeter with a second heater
- Patent number 7,275,862
- Issue date Oct 2, 2007
- SII NanoTechnology Inc.
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Thermogravimetry apparatus
- Patent number 6,709,153
- Issue date Mar 23, 2004
- SII NanoTechnology Inc.
- Rintaro Nakatani
- G01 - MEASURING TESTING
Information Patent Grant
Differential scanning calorimeter
- Patent number 6,508,585
- Issue date Jan 21, 2003
- Seiko Instruments Inc.
- Nobutaka Nakamura
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Differential scanning calorimeter
- Patent number 6,422,742
- Issue date Jul 23, 2002
- Seiko Instruments Inc.
- Ryoichi Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Heat flux type differential scanning calorimeter
- Patent number 6,390,669
- Issue date May 21, 2002
- Seiko Instruments Inc.
- Nobutaka Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Thermal analyzing apparatus
- Patent number 6,250,799
- Issue date Jun 26, 2001
- Seiko Instruments Inc.
- Ryoichi Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Differential thermal analyzer
- Patent number 6,146,012
- Issue date Nov 14, 2000
- Seiko Instruments Inc.
- Nobutaka Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Sample container sealer having function of setting load
- Patent number 5,718,097
- Issue date Feb 17, 1998
- Seiko Instruments Inc.
- Ryoichi Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Humidity control thermal analyzer
- Patent number 5,669,554
- Issue date Sep 23, 1997
- Seiko Instruments, Inc.
- Nobutaka Nakamura
- G05 - CONTROLLING REGULATING
Information Patent Grant
Thermal analyser
- Patent number 5,442,949
- Issue date Aug 22, 1995
- Seiko Instruments Inc.
- Ryoichi Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Method for automatic sample positioning
- Patent number 5,215,923
- Issue date Jun 1, 1993
- Seiko Instruments Inc.
- Ryoichi Kinoshita
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Thermal analysis instrument
- Patent number 5,193,910
- Issue date Mar 16, 1993
- Seiko Instruments, Inc.
- Ryoichi Kinoshita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HEAT FLOW FLUX TYPE DIFFERENTIAL SCANNING CALORIMETER
- Publication number 20080187020
- Publication date Aug 7, 2008
- SII NANO TECHNOLOGY INC.
- Ryoichi Kinoshita
- G01 - MEASURING TESTING
Information Patent Application
Thermal analysis system and method of drying the same
- Publication number 20080025364
- Publication date Jan 31, 2008
- Rintaro Nakatani
- G01 - MEASURING TESTING
Information Patent Application
Differential scanning calorimeter with a second heater
- Publication number 20050163188
- Publication date Jul 28, 2005
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Application
Thermogravimetry apparatus
- Publication number 20030086471
- Publication date May 8, 2003
- Rintaro Nakatani
- G01 - MEASURING TESTING
Information Patent Application
Differential scanning calorimeter
- Publication number 20020085615
- Publication date Jul 4, 2002
- Nobutaka Nakamura
- G01 - MEASURING TESTING

Ryoichi Kinoshita

Person

Patents Grantslast 30 patents

Thermal analysis system and method of drying the same

Heat flow flux type differential scanning calorimeter

Differential scanning calorimeter with a second heater

Thermogravimetry apparatus

Differential scanning calorimeter

Differential scanning calorimeter

Heat flux type differential scanning calorimeter

Thermal analyzing apparatus

Differential thermal analyzer

Sample container sealer having function of setting load

Humidity control thermal analyzer

Thermal analyser

Method for automatic sample positioning

Thermal analysis instrument

Patents Applicationslast 30 patents

HEAT FLOW FLUX TYPE DIFFERENTIAL SCANNING CALORIMETER

Thermal analysis system and method of drying the same

Differential scanning calorimeter with a second heater

Thermogravimetry apparatus

Differential scanning calorimeter