Ryoichi Matsuoka

Person

Yotsukaido, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor measurement apparatus and computer program
- Patent number 10,643,326
- Issue date May 5, 2020
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image evaluation apparatus and pattern shape evaluation apparatus
- Patent number 9,830,705
- Issue date Nov 28, 2017
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Overlay error measuring device and computer program
- Patent number 9,696,150
- Issue date Jul 4, 2017
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Scanning electron microscope device and pattern dimension measuring...
- Patent number 9,343,264
- Issue date May 17, 2016
- Hitachi High-Technologies Corporation
- Go Kotaki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image processing apparatus
- Patent number 9,183,622
- Issue date Nov 10, 2015
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of extracting contour lines of image data obtained by means...
- Patent number 8,994,815
- Issue date Mar 31, 2015
- Hitachi High-Technologies Corporation
- Hiroaki Mito
- G01 - MEASURING TESTING
Information Patent Grant
Pattern shape evaluation method and pattern shape evaluation apparatus
- Patent number 8,977,034
- Issue date Mar 10, 2015
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G01 - MEASURING TESTING
Information Patent Grant
Image processing device and computer program for performing image p...
- Patent number 8,972,911
- Issue date Mar 3, 2015
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for creating imaging recipe
- Patent number RE45224
- Issue date Oct 28, 2014
- Hitachi High-Technologies Corporation
- Atsushi Miyamoto
- 716 - Computer-aided design and analysis of circuits and semiconductor masks
Information Patent Grant
Method of creating template for matching, as well as device for cre...
- Patent number 8,867,818
- Issue date Oct 21, 2014
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for creating imaging recipe
- Patent number RE45204
- Issue date Oct 21, 2014
- Hitachi High-Technologies Corporation
- Atsushi Miyamoto
- 716 - Computer-aided design and analysis of circuits and semiconductor masks
Information Patent Grant
Scanning electron microscope and a method for imaging a specimen us...
- Patent number 8,853,630
- Issue date Oct 7, 2014
- Hitachi High-Technologies Corporation
- Atsushi Miyamoto
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measurement apparatus
- Patent number 8,788,242
- Issue date Jul 22, 2014
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and device for synthesizing panorama image using scanning ch...
- Patent number 8,767,038
- Issue date Jul 1, 2014
- Hitachi High-Technologies Corporation
- Atsushi Miyamoto
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method, pattern inspection apparatus and pattern...
- Patent number 8,705,841
- Issue date Apr 22, 2014
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing apparatus, image processing method, and image proc...
- Patent number 8,687,921
- Issue date Apr 1, 2014
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern generating apparatus and pattern shape evaluating apparatus
- Patent number 8,655,050
- Issue date Feb 18, 2014
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and a method for imaging a specimen us...
- Patent number 8,642,957
- Issue date Feb 4, 2014
- Hitachi High-Technologies Corporation
- Atsushi Miyamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring sample and measurement device
- Patent number 8,581,187
- Issue date Nov 12, 2013
- Hitachi High-Technologies Corporation
- Mihoko Kijima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of pattern inspection and semiconductor inspec...
- Patent number 8,577,124
- Issue date Nov 5, 2013
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for image generation
- Patent number 8,577,125
- Issue date Nov 5, 2013
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern generating apparatus and pattern shape evaluating apparatus
- Patent number 8,515,155
- Issue date Aug 20, 2013
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measuring method and pattern measuring device
- Patent number 8,507,856
- Issue date Aug 13, 2013
- Hitachi High-Technologies Corporation
- Takumichi Sutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement apparatus
- Patent number 8,445,871
- Issue date May 21, 2013
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern generating apparatus and pattern shape evaluating apparatus
- Patent number 8,363,923
- Issue date Jan 29, 2013
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G01 - MEASURING TESTING
Information Patent Grant
Pattern shape evaluation method
- Patent number 8,355,562
- Issue date Jan 15, 2013
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample dimension inspecting/measuring method and sample dimension i...
- Patent number 8,338,804
- Issue date Dec 25, 2012
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measuring method and pattern measuring device
- Patent number 8,311,314
- Issue date Nov 13, 2012
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern measurement methods and pattern measurement equipment
- Patent number 8,295,584
- Issue date Oct 23, 2012
- Hitachi High-Technologies Corporation
- Hidetoshi Sato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern displacement measuring method and pattern measuring device
- Patent number 8,173,962
- Issue date May 8, 2012
- Hitachi High-Technologies Corporation
- Takumichi Sutani
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE EVALUATION APPARATUS AND PATTERN SHAPE EVALUATION APPARATUS
- Publication number 20150287201
- Publication date Oct 8, 2015
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OVERLAY ERROR MEASURING DEVICE AND COMPUTER PROGRAM
- Publication number 20150136976
- Publication date May 21, 2015
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Measurement Apparatus and Computer Program
- Publication number 20150009319
- Publication date Jan 8, 2015
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND A METHOD FOR IMAGING A SPECIMEN US...
- Publication number 20140145078
- Publication date May 29, 2014
- Hitachi High-Technologies Corporation
- Atsushi Miyamoto
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING DEVICE AND COMPUTER PROGRAM FOR PERFORMING IMAGE P...
- Publication number 20130326439
- Publication date Dec 5, 2013
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- G01 - MEASURING TESTING
Information Patent Application
PATTERN GENERATING APPARATUS AND PATTERN SHAPE EVALUATING APPARATUS
- Publication number 20130315468
- Publication date Nov 28, 2013
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING APPARATUS AND COMPUTER PROGRAM
- Publication number 20130279793
- Publication date Oct 24, 2013
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANAGING APPARATUS OF SEMICONDUCTOR MANUFACTURING APPARATUS AND COM...
- Publication number 20130150998
- Publication date Jun 13, 2013
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN GENERATING APPARATUS AND PATTERN SHAPE EVALUATING APPARATUS
- Publication number 20130136335
- Publication date May 30, 2013
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G01 - MEASURING TESTING
Information Patent Application
PATTERN SHAPE EVALUATION METHOD, PATTERN SHAPE EVALUATION DEVICE, P...
- Publication number 20130117723
- Publication date May 9, 2013
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image Processing Apparatus, Image Processing Method, and Image Proc...
- Publication number 20130011080
- Publication date Jan 10, 2013
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Extracting Contour Lines of Image Data Obtained By Means...
- Publication number 20120300054
- Publication date Nov 29, 2012
- Hitachi High-Technologies Corporation
- Hiroaki Mito
- G01 - MEASURING TESTING
Information Patent Application
Pattern Measuring Condition Setting Device
- Publication number 20120290990
- Publication date Nov 15, 2012
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERN MEASURING METHOD AND PATTERN MEASURING DEVICE
- Publication number 20120211653
- Publication date Aug 23, 2012
- Takumichi Sutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope and a Method for Imaging a Specimen Us...
- Publication number 20120181426
- Publication date Jul 19, 2012
- Atsushi MIYAMOTO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CREATING TEMPLATE FOR MATCHING, AS WELL AS DEVICE FOR CRE...
- Publication number 20120121160
- Publication date May 17, 2012
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN SHAPE EVALUATION METHOD AND PATTERN SHAPE EVALUATION APPARATUS
- Publication number 20120106826
- Publication date May 3, 2012
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF PATTERN INSPECTION AND SEMICONDUCTOR INSPEC...
- Publication number 20120099781
- Publication date Apr 26, 2012
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE DEVICE AND PATTERN DIMENSION MEASURING...
- Publication number 20120098953
- Publication date Apr 26, 2012
- Go Kotaki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND DEVICE FOR CREATING COMPOSITE IMAGE
- Publication number 20120092482
- Publication date Apr 19, 2012
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN GENERATING APPARATUS AND PATTERN SHAPE EVALUATING APPARATUS
- Publication number 20120057774
- Publication date Mar 8, 2012
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN MEASUREMENT APPARATUS
- Publication number 20120053892
- Publication date Mar 1, 2012
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND DEVICE FOR SYNTHESIZING PANORAMA IMAGE USING SCANNING CH...
- Publication number 20110181688
- Publication date Jul 28, 2011
- Atsushi Miyamoto
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE DIMENSION INSPECTING/MEASURING METHOD AND SAMPLE DIMENSION I...
- Publication number 20110158543
- Publication date Jun 30, 2011
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MEASURING SAMPLE AND MEASUREMENT DEVICE
- Publication number 20110139982
- Publication date Jun 16, 2011
- Hitachi High-Technologies Corporation
- Mihoko Kijima
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION METHOD, PATTERN INSPECTION APPARATUS AND PATTERN...
- Publication number 20110142326
- Publication date Jun 16, 2011
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Wafer Inspection
- Publication number 20110096309
- Publication date Apr 28, 2011
- IMEC
- Vincent Jean-Marie Pierre Paul Wiaux
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COMPOSITE PICTURE FORMING METHOD AND PICTURE FORMING APPARATUS
- Publication number 20110074817
- Publication date Mar 31, 2011
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN MEASUREMENT APPARATUS
- Publication number 20100202654
- Publication date Aug 12, 2010
- Hitachi High-Technologies Corporation
- Ryoichi MATSUOKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN DISPLACEMENT MEASURING METHOD AND PATTERN MEASURING DEVICE
- Publication number 20100140472
- Publication date Jun 10, 2010
- Hitachi High-Technologies Corporation
- Takumichi SUTANI
- G06 - COMPUTING CALCULATING COUNTING

Ryoichi Matsuoka

Person

Patents Grantslast 30 patents

Semiconductor measurement apparatus and computer program

Image evaluation apparatus and pattern shape evaluation apparatus

Overlay error measuring device and computer program

Scanning electron microscope device and pattern dimension measuring...

Image processing apparatus

Method of extracting contour lines of image data obtained by means...

Pattern shape evaluation method and pattern shape evaluation apparatus

Image processing device and computer program for performing image p...

Method and apparatus for creating imaging recipe

Method of creating template for matching, as well as device for cre...

Method and apparatus for creating imaging recipe

Scanning electron microscope and a method for imaging a specimen us...

Pattern measurement apparatus

Method and device for synthesizing panorama image using scanning ch...

Pattern inspection method, pattern inspection apparatus and pattern...

Image processing apparatus, image processing method, and image proc...

Pattern generating apparatus and pattern shape evaluating apparatus

Scanning electron microscope and a method for imaging a specimen us...

Method for measuring sample and measurement device

Method and apparatus of pattern inspection and semiconductor inspec...

Method and apparatus for image generation

Pattern generating apparatus and pattern shape evaluating apparatus

Pattern measuring method and pattern measuring device

Pattern measurement apparatus

Pattern generating apparatus and pattern shape evaluating apparatus

Pattern shape evaluation method

Sample dimension inspecting/measuring method and sample dimension i...

Pattern measuring method and pattern measuring device

Pattern measurement methods and pattern measurement equipment

Pattern displacement measuring method and pattern measuring device

Patents Applicationslast 30 patents

IMAGE EVALUATION APPARATUS AND PATTERN SHAPE EVALUATION APPARATUS

OVERLAY ERROR MEASURING DEVICE AND COMPUTER PROGRAM

Semiconductor Measurement Apparatus and Computer Program

SCANNING ELECTRON MICROSCOPE AND A METHOD FOR IMAGING A SPECIMEN US...

IMAGE PROCESSING DEVICE AND COMPUTER PROGRAM FOR PERFORMING IMAGE P...

PATTERN GENERATING APPARATUS AND PATTERN SHAPE EVALUATING APPARATUS

IMAGE PROCESSING APPARATUS AND COMPUTER PROGRAM

MANAGING APPARATUS OF SEMICONDUCTOR MANUFACTURING APPARATUS AND COM...

PATTERN GENERATING APPARATUS AND PATTERN SHAPE EVALUATING APPARATUS

PATTERN SHAPE EVALUATION METHOD, PATTERN SHAPE EVALUATION DEVICE, P...

Image Processing Apparatus, Image Processing Method, and Image Proc...

Method of Extracting Contour Lines of Image Data Obtained By Means...

Pattern Measuring Condition Setting Device

PATTERN MEASURING METHOD AND PATTERN MEASURING DEVICE

Scanning Electron Microscope and a Method for Imaging a Specimen Us...

METHOD OF CREATING TEMPLATE FOR MATCHING, AS WELL AS DEVICE FOR CRE...

PATTERN SHAPE EVALUATION METHOD AND PATTERN SHAPE EVALUATION APPARATUS

METHOD AND APPARATUS OF PATTERN INSPECTION AND SEMICONDUCTOR INSPEC...

SCANNING ELECTRON MICROSCOPE DEVICE AND PATTERN DIMENSION MEASURING...

METHOD AND DEVICE FOR CREATING COMPOSITE IMAGE

PATTERN GENERATING APPARATUS AND PATTERN SHAPE EVALUATING APPARATUS

PATTERN MEASUREMENT APPARATUS

METHOD AND DEVICE FOR SYNTHESIZING PANORAMA IMAGE USING SCANNING CH...

SAMPLE DIMENSION INSPECTING/MEASURING METHOD AND SAMPLE DIMENSION I...

METHOD FOR MEASURING SAMPLE AND MEASUREMENT DEVICE

PATTERN INSPECTION METHOD, PATTERN INSPECTION APPARATUS AND PATTERN...

Method and System for Wafer Inspection

COMPOSITE PICTURE FORMING METHOD AND PICTURE FORMING APPARATUS

PATTERN MEASUREMENT APPARATUS

PATTERN DISPLACEMENT MEASURING METHOD AND PATTERN MEASURING DEVICE