Ryoji YOSHIKAWA

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Yokohama Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection method and inspection apparatus
- Patent number 11,978,195
- Issue date May 7, 2024
- Kioxia Corporation
- Keisuke Chiba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device and inspection method
- Patent number 11,906,440
- Issue date Feb 20, 2024
- Kioxia Corporation
- Ryoji Yoshikawa
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 10,976,656
- Issue date Apr 13, 2021
- TOSHIBA MEMORY CORPORATION
- Ryoji Yoshikawa
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20230100104
- Publication date Mar 30, 2023
- KIOXIA Corporation
- Ryoji Yoshikawa
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20220230289
- Publication date Jul 21, 2022
- KIOXIA Corporation
- Keisuke CHIBA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ORIGINAL PLATE MANUFACTURING METHOD, DRAWING DATA CREATION METHOD,...
- Publication number 20220035243
- Publication date Feb 3, 2022
- KIOXIA Corporation
- Ryoji YOSHIKAWA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20190285980
- Publication date Sep 19, 2019
- Toshiba Memory Corporation
- Ryoji YOSHIKAWA
- G06 - COMPUTING CALCULATING COUNTING