Ryokuhei YAMAZAKI

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for acquiring polarized images
- Patent number 12,320,740
- Issue date Jun 3, 2025
- Hitachi High-Tech Science Corporation
- Hirohito Fujiwara
- G01 - MEASURING TESTING
Information Patent Grant
Controller for thermal analysis apparatus, and thermal analysis app...
- Patent number 11,680,917
- Issue date Jun 20, 2023
- Hitachi High-Tech Science Corporation
- Ryokuhei Yamazaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE CONTAINER AND THERMAL ANALYZER
- Publication number 20250224356
- Publication date Jul 10, 2025
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ryokuhei YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CONTAINER AND THERMAL ANALYZER
- Publication number 20250224355
- Publication date Jul 10, 2025
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Shuta NAKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION IMAGE ACQUISITION APPARATUS AND THERMAL ANALYZER
- Publication number 20240125724
- Publication date Apr 18, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hirohito FUJIWARA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ACQUIRING POLARIZED IMAGES
- Publication number 20230296497
- Publication date Sep 21, 2023
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hirohito FUJIWARA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CONTAINER FOR THERMAL ANALYSIS AND THERMAL ANALYZER
- Publication number 20210302342
- Publication date Sep 30, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ryokuhei YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLER FOR THERMAL ANALYSIS APPARATUS, AND THERMAL ANALYSIS APP...
- Publication number 20210278353
- Publication date Sep 9, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ryokuhei YAMAZAKI
- G01 - MEASURING TESTING