Ryosuke KAWANO

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Saiki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Voltage detection apparatus
- Patent number 8,278,878
- Issue date Oct 2, 2012
- Yazaki Corporation
- Satoshi Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Voltage detection apparatus
- Patent number 8,013,618
- Issue date Sep 6, 2011
- Yazaki Corporation
- Satoshi Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Voltage detector and insulator interface
- Patent number 7,405,579
- Issue date Jul 29, 2008
- Yazaki Corporation
- Hajime Okamoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VOLTAGE DETECTION APPARATUS
- Publication number 20100060256
- Publication date Mar 11, 2010
- YAZAKI CORPORATION
- Satoshi ISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE DETECTION APPARATUS
- Publication number 20100060295
- Publication date Mar 11, 2010
- YAZAKI CORPORATION
- Satoshi ISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
Voltage detector and insulator interface
- Publication number 20070132457
- Publication date Jun 14, 2007
- YAZAKI CORPORATION
- Hajime Okamoto
- G01 - MEASURING TESTING