Ryosuke OKACHI

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Nagakute-shi, JP

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Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR PREDICTING FAILURE OF SEMICONDUCTOR DEVICE, AND SEMICOND...
- Publication number 20240110970
- Publication date Apr 4, 2024
- DENSO CORPORATION
- Masataka DEGUCHI
- G01 - MEASURING TESTING
Information Patent Application
STATE DETERMINATION DEVICE AND VEHICLE
- Publication number 20230408572
- Publication date Dec 21, 2023
- DENSO CORPORATION
- Junya MURAMATSU
- G01 - MEASURING TESTING