Ryota Nishikawa

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Shiga, JP

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Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND ELECTRONIC INFORMATION DEVICE
- Publication number 20110210748
- Publication date Sep 1, 2011
- PANASONIC CORPORATION
- Ryota NISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
Memory system
- Publication number 20080028260
- Publication date Jan 31, 2008
- Mutsumi Oyagi
- G11 - INFORMATION STORAGE
Information Patent Application
Method and device of generating test circuit for semiconductor device
- Publication number 20070274142
- Publication date Nov 29, 2007
- Ryota Nishikawa
- G11 - INFORMATION STORAGE