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Ryota WATANABE

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer
    • Patent number 12,085,581
    • Issue date Sep 10, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Masayuki Ito
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20250199027
    • Publication date Jun 19, 2025
    • HITACHI HIGH-TECH CORPORATION
    • Ryota WATANABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzing Device and Reagent Management Method in Automat...
    • Publication number 20250085305
    • Publication date Mar 13, 2025
    • Hitachi High-Tech Corporation
    • Takahiro KUMAGAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTROLYTE ANALYZER
    • Publication number 20230288439
    • Publication date Sep 14, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takushi MIYAKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220026453
    • Publication date Jan 27, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Masayuki ITO
    • G01 - MEASURING TESTING