Ryou Nakagaki

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for observing specimen and device therefor
- Patent number 6,756,589
- Issue date Jun 29, 2004
- Hitachi, Ltd.
- Kenji Obara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for classifying defects and device for the same
- Publication number 20010042705
- Publication date Nov 22, 2001
- Ryou Nakagaki
- G01 - MEASURING TESTING