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Ryou Tanaka
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Ishikawa, JP
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Patents Grants
last 30 patents
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Patent Grant
Analytical method and analytical apparatus
Patent number
8,110,406
Issue date
Feb 7, 2012
Japan Advanced Institute of Science and Technology
Eiichi Tamiya
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Analytical Method and Analytical Apparatus
Publication number
20090047746
Publication date
Feb 19, 2009
Japan Science and Technology Agency
Eiichi Tamiya
G01 - MEASURING TESTING