Ryouichi Yokoyama

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Diffraction condition simulation device, diffraction measurement sy...
- Patent number 7,337,098
- Issue date Feb 26, 2008
- Rigaku Corporation
- Ryouichi Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Stress measurement method using X-ray diffraction
- Patent number 7,003,074
- Issue date Feb 21, 2006
- Rigaku Corporation
- Ryouichi Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Pole measuring method
- Patent number 6,937,694
- Issue date Aug 30, 2005
- Rigaku Corporation
- Ryouichi Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Stress measurement method using X-ray diffraction
- Patent number 6,874,369
- Issue date Apr 5, 2005
- Rigaku Corporation
- Ryouichi Yokoyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DAMAGE MEASUREMENT METHOD, APPARATUS AND PROGRAM, AND X-RAY DIFFRAC...
- Publication number 20230304948
- Publication date Sep 28, 2023
- Rigaku Corporation
- Ryouichi YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
Stress measurement method using X-ray diffraction
- Publication number 20050190880
- Publication date Sep 1, 2005
- Rigaku Corporation
- Ryouichi Yokoyama
- G01 - MEASURING TESTING
Information Patent Application
Stress measurement method using X-ray diffraction
- Publication number 20040177700
- Publication date Sep 16, 2004
- Rigaku Corporation
- Ryouichi Yokoyama
- G01 - MEASURING TESTING
Information Patent Application
Pole measuring method
- Publication number 20030012335
- Publication date Jan 16, 2003
- Ryouichi Yokoyama
- G01 - MEASURING TESTING
Information Patent Application
Diffraction condition simulation device, diffraction measurement sy...
- Publication number 20030009316
- Publication date Jan 9, 2003
- Ryouichi Yokoyama
- G01 - MEASURING TESTING