Ryu Maeda

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit test socket
- Patent number 6,152,744
- Issue date Nov 28, 2000
- Molex Incorporated
- Ryu Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Low-temperature burnt conductive paste and method of manufacturing...
- Patent number 4,894,184
- Issue date Jan 16, 1990
- The Furukawa Electric Co., Ltd.
- Shingoro Fukuoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aluminum enamel board
- Patent number 4,842,959
- Issue date Jun 27, 1989
- The Furukawa Electric Co., Ltd.
- Ryu Maeda
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
System for testing bare IC chips and a socket for such chips
- Publication number 20010012725
- Publication date Aug 9, 2001
- Ryu Maeda
- G01 - MEASURING TESTING