Ryuichi Funatsu

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical information processing apparatus and optical pickup therefor
- Patent number 5,195,070
- Issue date Mar 16, 1993
- Hitachi, Ltd.
- Masataka Shiba
- G11 - INFORMATION STORAGE
Information Patent Grant
Beam control method and apparatus
- Patent number 5,134,298
- Issue date Jul 28, 1992
- Hitachi, Ltd.
- Akira Inagaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring optical constants of a thin film...
- Patent number 5,125,740
- Issue date Jun 30, 1992
- Hitachi, Ltd.
- Hidemi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Information detecting system of scanning type
- Patent number 5,121,449
- Issue date Jun 9, 1992
- Hitachi, Ltd.
- Masataka Shiba
- G02 - OPTICS
Information Patent Grant
Exposure method and apparatus
- Patent number 5,008,702
- Issue date Apr 16, 1991
- Hitachi, Ltd.
- Tsutomu Tanaka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
X-ray lithography apparatus
- Patent number 4,852,133
- Issue date Jul 25, 1989
- Hitachi, Ltd.
- Minoru Ikeda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for alignment
- Patent number 4,777,641
- Issue date Oct 11, 1988
- Hitachi, Ltd.
- Akira Inagaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Light-exposure apparatus
- Patent number 4,666,291
- Issue date May 19, 1987
- Hitachi, Ltd.
- Motoya Taniguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Ryuichi Funatsu

Person

Patents Grantslast 30 patents

Optical information processing apparatus and optical pickup therefor

Beam control method and apparatus

Method and apparatus for measuring optical constants of a thin film...

Information detecting system of scanning type

Exposure method and apparatus

X-ray lithography apparatus

Method and apparatus for alignment

Light-exposure apparatus