Ryuichi Matsuzaki

Follow

Person

Chiba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe scanning device
- Patent number 6,734,426
- Issue date May 11, 2004
- SII NanoTechnology Inc.
- Ryuichi Matsuzaki
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe instrument
- Patent number 6,661,006
- Issue date Dec 9, 2003
- Seiko Instruments Inc.
- Yukihiro Sato
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and method of measuring geometry of sampl...
- Patent number 6,499,340
- Issue date Dec 31, 2002
- Seiko Instruments Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 5,983,713
- Issue date Nov 16, 1999
- Seiko Instruments Inc.
- Ryuichi Matsuzaki
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Probe scanning device
- Publication number 20030010928
- Publication date Jan 16, 2003
- Ryuichi Matsuzaki
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning probe instrument
- Publication number 20020005482
- Publication date Jan 17, 2002
- Yukihiro Sato
- B82 - NANO-TECHNOLOGY