Ryuichi Ogino

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection apparatus and method
- Patent number 8,809,778
- Issue date Aug 19, 2014
- Advantest Corp.
- Ryuichi Ogino
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD
- Publication number 20130234020
- Publication date Sep 12, 2013
- Ryuichi Ogino
- H01 - BASIC ELECTRIC ELEMENTS