Ryuichi Takagi

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Manufacturing method of a probe head for semiconductor LSI inspecti...
- Patent number 5,191,708
- Issue date Mar 9, 1993
- Hitachi, Ltd.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Cooling system and method for electronic circuit devices
- Patent number 4,897,762
- Issue date Jan 30, 1990
- Hitachi, Ltd.
- Takahiro Daikoku
- H01 - BASIC ELECTRIC ELEMENTS