Ryuichi Takebuchi

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Yamanashi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe apparatus and method of alignment for the same
- Patent number 5,321,352
- Issue date Jun 14, 1994
- Tokyo Electron Yamanashi Limited
- Ryuichi Takebuchi
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting electric characteristics of wafers and apparat...
- Patent number 5,124,931
- Issue date Jun 23, 1992
- Tokyo Electron Limited
- Masaaki Iwamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method of positioning objects to be measured
- Patent number 4,966,520
- Issue date Oct 30, 1990
- Tokyo Electron Limited
- Keiichi Yokota
- G01 - MEASURING TESTING