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Ryuichiro Abe
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Ichinomiya-city, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Magnetic sensor and method for manufacturing said magnetic sensor
Patent number
10,901,049
Issue date
Jan 26, 2021
Denso Corporation
Takamoto Furuichi
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor sensor and manufacturing method therefor
Patent number
7,770,452
Issue date
Aug 10, 2010
Denso Corporation
Minekazu Sakai
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Semiconductor device having impurity-doped resistor element
Patent number
7,670,918
Issue date
Mar 2, 2010
Denso Corporation
Yuko Fukami
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, method for manufacturing the same, and re...
Patent number
7,615,832
Issue date
Nov 10, 2009
Denso Corporation
Ichiharu Kondoh
G01 - MEASURING TESTING
Information
Patent Grant
Sensor device
Patent number
7,541,574
Issue date
Jun 2, 2009
Denso Corporation
Yasunori Ninomiya
G01 - MEASURING TESTING
Information
Patent Grant
Packaging method
Patent number
7,470,996
Issue date
Dec 30, 2008
Denso Corporation
Takao Yoneyama
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Semiconductor sensor and manufacturing method therefor
Patent number
7,373,821
Issue date
May 20, 2008
Denso Corporation
Minekazu Sakai
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Sensor device
Patent number
7,327,004
Issue date
Feb 5, 2008
Denso Corporation
Koji Hattori
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
PIEZOELECTRIC FILM LAMINATED BODY AND MANUFACTURING METHOD OF THE SAME
Publication number
20230413675
Publication date
Dec 21, 2023
DENSO CORPORATION
AKIHIKO TESHIGAHARA
Information
Patent Application
PIEZOELECTRIC ELEMENT, PIEZOELECTRIC DEVICE, AND METHOD OF MANUFACT...
Publication number
20230243710
Publication date
Aug 3, 2023
DENSO CORPORATION
TOMOYA JOMORI
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR AND METHOD FOR MANUFACTURING SAID MAGNETIC SENSOR
Publication number
20190242957
Publication date
Aug 8, 2019
DENSO CORPORATION
Takamoto FURUICHI
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor sensor and manufacturing method therefor
Publication number
20080196501
Publication date
Aug 21, 2008
DENSO CORPORATION
Minekazu Sakai
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Semiconductor device having impurity-doped resistor element
Publication number
20080188027
Publication date
Aug 7, 2008
DENSO CORPORATION
Yuko Fukami
G01 - MEASURING TESTING
Information
Patent Application
Sensor device
Publication number
20070284713
Publication date
Dec 13, 2007
DENSO CORPORATION
Yasunori Ninomiya
G01 - MEASURING TESTING
Information
Patent Application
Physical quantity sensor, method for manufacturing the same, and re...
Publication number
20070235825
Publication date
Oct 11, 2007
DENSO CORPORATION
Ichiharu Kondoh
G01 - MEASURING TESTING
Information
Patent Application
Sensor having semiconductor chip and circuit chip
Publication number
20070090536
Publication date
Apr 26, 2007
DENSO CORPORATION
Minekazu Sakai
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Packaging method
Publication number
20070023483
Publication date
Feb 1, 2007
DENSO CORPORATION
Takao Yoneyama
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Semiconductor sensor and manufacturing mehtod therefor
Publication number
20070007607
Publication date
Jan 11, 2007
DENSO CORPORATION
Minekazu Sakai
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Sensor device
Publication number
20060097331
Publication date
May 11, 2006
DENSO CORPORATION
Koji Hattori
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Diode and producing method thereof
Publication number
20040016971
Publication date
Jan 29, 2004
Ryuichiro Abe
H01 - BASIC ELECTRIC ELEMENTS