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Ryuichiro Mitani
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Method of semiconductor manufacturing apparatus and non-transitory...
Patent number
10,890,899
Issue date
Jan 12, 2021
Ebara Corporation
Ryuichiro Mitani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Processing end point detection method, polishing method, and polish...
Patent number
10,207,390
Issue date
Feb 19, 2019
TOSHIBA MEMORY CORPORATION
Noburu Shimizu
B24 - GRINDING POLISHING
Information
Patent Grant
Processing end point detection method, polishing method, and polish...
Patent number
8,554,356
Issue date
Oct 8, 2013
Ebara Corporation
Noburu Shimizu
B24 - GRINDING POLISHING
Information
Patent Grant
Polished state monitoring apparatus and polishing apparatus using t...
Patent number
7,300,332
Issue date
Nov 27, 2007
Ebara Corporation
Yoichi Kobayashi
B24 - GRINDING POLISHING
Patents Applications
last 30 patents
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Patent Application
DESIGN METHOD OF SEMICONDUCTOR MANUFACTURING APPARATUS AND NON-TRAN...
Publication number
20190171193
Publication date
Jun 6, 2019
EBARA CORPORATION
Ryuichiro MITANI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PROCESSING END POINT DETECTION METHOD, POLISHING METHOD, AND POLISH...
Publication number
20140004773
Publication date
Jan 2, 2014
Kabushiki Kaisha Toshiba
Noburu SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
REMOTE MONITORING SYSTEM FOR POLISHING END POINT DETECTION UNITS
Publication number
20130268106
Publication date
Oct 10, 2013
Ryuichiro MITANI
B24 - GRINDING POLISHING
Information
Patent Application
Processing end point detection method, polishing method,and polishi...
Publication number
20100015889
Publication date
Jan 21, 2010
Noburu Shimizu
G05 - CONTROLLING REGULATING
Information
Patent Application
Method and apparatus for measuring a polishing condition
Publication number
20060274326
Publication date
Dec 7, 2006
Yoichi Kobayashi
B24 - GRINDING POLISHING