Ryuichiro Tamochi

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus, specimen observation system and op...
- Patent number 9,792,832
- Issue date Oct 17, 2017
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,058,957
- Issue date Jun 16, 2015
- Hitachi High-Technologies Corporation
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,657,193
- Issue date Dec 2, 2003
- Hitachi High-Technologies Corporation
- Yukari Dan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...
- Publication number 20150074523
- Publication date Mar 12, 2015
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140131590
- Publication date May 15, 2014
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20030080293
- Publication date May 1, 2003
- Yukari Dan
- H01 - BASIC ELECTRIC ELEMENTS