TREA

Ryuichirou Tamochi

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Scanning electron microscope
    • Patent number 7,217,925
    • Issue date May 15, 2007
    • Hitachi, Ltd.
    • Yoshinori Nakada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Scanning electron microscope
    • Patent number 7,009,178
    • Issue date Mar 7, 2006
    • Hitachi, Ltd.
    • Yoshinori Nakada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Scanning electron microscope
    • Patent number 6,897,445
    • Issue date May 24, 2005
    • Hitachi, Ltd.
    • Yoshinori Nakada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Scanning electron microscope
    • Patent number 6,713,761
    • Issue date Mar 30, 2004
    • Hitachi, Ltd.
    • Yoshinori Nakada
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    Scanning electron microscope
    • Publication number 20060102840
    • Publication date May 18, 2006
    • Yoshinori Nakada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Scanning electron microscope
    • Publication number 20050178965
    • Publication date Aug 18, 2005
    • Yoshinori Nakada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Scanning electron microscope
    • Publication number 20040094713
    • Publication date May 20, 2004
    • Yoshinori Nakada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Scanning electron microscope
    • Publication number 20010054692
    • Publication date Dec 27, 2001
    • Yoshinori Nakada
    • H01 - BASIC ELECTRIC ELEMENTS