Ryuji Kitakado

Person

Tenjinkitamachi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Substrate processing apparatus
- Patent number 5,963,753
- Issue date Oct 5, 1999
- Dainippon Screen Mfg. Co., Ltd.
- Masami Ohtani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of and apparatus for inspecting the minimum annular width of...
- Patent number 5,408,538
- Issue date Apr 18, 1995
- Dainippon Screen Mfg. Co., Ltd.
- Ryuji Kitakado
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for detecting neck disconnection between land...
- Patent number 5,398,291
- Issue date Mar 14, 1995
- Dainippon Screen Mfg. Co., Ltd.
- Ryuji Kitakado
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of and apparatus for obtaining binary image
- Patent number 5,315,409
- Issue date May 24, 1994
- Dainippon Screen Mfg. Co., Ltd.
- Akira Matsumura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of and device for inspecting pattern of printed circuit board
- Patent number 5,161,202
- Issue date Nov 3, 1992
- Dainippon Screen Mfg. Co. Ltd.
- Ryuji Kitakado
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of and apparatus for inspecting conductive pattern on printe...
- Patent number 5,150,422
- Issue date Sep 22, 1992
- Dainippon Screen Mfg. Co., Ltd.
- Ryuji Kitakado
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of and apparatus for inspecting conductive pattern on printe...
- Patent number 5,144,681
- Issue date Sep 1, 1992
- Dainnippon Screen Mfg. Co., Ltd.
- Ryuji Kitakado
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of and device for compensating for reading-position error of...
- Patent number 5,144,132
- Issue date Sep 1, 1992
- Dainippon Screen Mfg. Co., Ltd.
- Ryuji Kitakado
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for inspecting conductive pattern on printe...
- Patent number 5,027,417
- Issue date Jun 25, 1991
- Dainippon Screen Mfg. Co., Ltd.
- Ryuji Kitakado
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of and apparatus for detecting pattern defects
- Patent number 4,803,734
- Issue date Feb 7, 1989
- Dainippon Screen Mfg. Co., Ltd.
- Hiroyuki Onishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern masking method and an apparatus therefor
- Patent number 4,797,939
- Issue date Jan 10, 1989
- Dainippon Screen Mfg. Co., Ltd.
- Tetsuo Hoki
- G06 - COMPUTING CALCULATING COUNTING

Ryuji Kitakado

Person

Patents Grantslast 30 patents

Substrate processing apparatus

Method of and apparatus for inspecting the minimum annular width of...

Method and apparatus for detecting neck disconnection between land...

Method of and apparatus for obtaining binary image

Method of and device for inspecting pattern of printed circuit board

Method of and apparatus for inspecting conductive pattern on printe...

Method of and apparatus for inspecting conductive pattern on printe...

Method of and device for compensating for reading-position error of...

Method of and apparatus for inspecting conductive pattern on printe...

Method of and apparatus for detecting pattern defects

Pattern masking method and an apparatus therefor