Ryuji Kohno

Person

Ibaraki-ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Membrane electrode composite module, fuel cell and electronic equip...
- Patent number 7,862,952
- Issue date Jan 4, 2011
- Hitachi, Ltd.
- Ryuji Kohno
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 7,198,962
- Issue date Apr 3, 2007
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Probe structure
- Patent number 6,977,514
- Issue date Dec 20, 2005
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a semiconductor device
- Patent number 6,955,870
- Issue date Oct 18, 2005
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for carrying out inspection of a semiconductor de...
- Patent number 6,952,110
- Issue date Oct 4, 2005
- Renesas Technology Corporation
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and test device for same
- Patent number 6,885,208
- Issue date Apr 26, 2005
- Renesas Technology Corp.
- Toshio Miyatake
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and contractor for inspection
- Patent number 6,876,073
- Issue date Apr 5, 2005
- Renesas Technology Corp.
- Hideo Miura
- G01 - MEASURING TESTING
Information Patent Grant
Packaging device for holding a plurality of semiconductor devices t...
- Patent number 6,864,568
- Issue date Mar 8, 2005
- Renesas Technology Corp.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and semiconductor device man...
- Patent number 6,864,695
- Issue date Mar 8, 2005
- Renesas Technology Corp.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and method for manufacturing...
- Patent number 6,828,810
- Issue date Dec 7, 2004
- Renesas Technology Corp.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor-device inspecting apparatus and a method for manufact...
- Patent number 6,774,654
- Issue date Aug 10, 2004
- Renesas Technology Corp.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection apparatus
- Patent number 6,714,030
- Issue date Mar 30, 2004
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication method of semiconductor integrated circuit device and i...
- Patent number 6,696,849
- Issue date Feb 24, 2004
- Renesas Technology Corporation
- Naoto Ban
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and a manufacturing method thereof
- Patent number 6,660,541
- Issue date Dec 9, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe structure
- Patent number 6,614,246
- Issue date Sep 2, 2003
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 6,566,150
- Issue date May 20, 2003
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Manufacture method for semiconductor inspection apparatus
- Patent number 6,548,315
- Issue date Apr 15, 2003
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing semiconductor device utilizing semiconduct...
- Patent number 6,531,327
- Issue date Mar 11, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing equipment with probe formed on a cantilever o...
- Patent number 6,507,204
- Issue date Jan 14, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor-device inspecting apparatus and a method for manufact...
- Patent number 6,496,023
- Issue date Dec 17, 2002
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Contactor for inspection
- Patent number 6,492,829
- Issue date Dec 10, 2002
- Hitachi, Ltd.
- Hideo Miura
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing semiconductor device and apparatus usable therein
- Patent number 6,465,264
- Issue date Oct 15, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 6,455,335
- Issue date Sep 24, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Manufacture method for semiconductor inspection apparatus
- Patent number 6,358,762
- Issue date Mar 19, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 6,297,073
- Issue date Oct 2, 2001
- Hitachi, Ltd.
- Makoto Kitano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TSOP type semiconductor device
- Patent number 6,232,653
- Issue date May 15, 2001
- Hitachi, Ltd.
- Naotaka Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 6,197,603
- Issue date Mar 6, 2001
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 6,130,112
- Issue date Oct 10, 2000
- Hitachi, Ltd.
- Makoto Kitano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 6,049,128
- Issue date Apr 11, 2000
- Hitachi, Ltd.
- Makoto Kitano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, lead frame therefor and memory card to provid...
- Patent number 5,635,756
- Issue date Jun 3, 1997
- Hitachi, Ltd.
- Ryuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FUEL CELL SYSTEM
- Publication number 20110151343
- Publication date Jun 23, 2011
- Ryuji Kohno
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
FUEL CELL SYSTEM
- Publication number 20080085431
- Publication date Apr 10, 2008
- Ryuji Kohno
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Fuel cell, refueling device for the fuel cell, and electronic devic...
- Publication number 20070202379
- Publication date Aug 30, 2007
- Ryuji Kohno
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Electronic components
- Publication number 20070190387
- Publication date Aug 16, 2007
- Ryuji Kohno
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Cell holder, fuel cell module and electronic equipment
- Publication number 20070048600
- Publication date Mar 1, 2007
- Ryuji Kohno
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Holding structure and electronic apparatus installing that therein
- Publication number 20070037035
- Publication date Feb 15, 2007
- Miyuki Fukushi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Fuel cell unit, fuel cell unit assembly and electronic equipment
- Publication number 20060216568
- Publication date Sep 28, 2006
- Ryuji Kohno
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Membrane electrode composite module, fuel cell and electronic equip...
- Publication number 20060024555
- Publication date Feb 2, 2006
- Ryuji Kohno
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Fuel cell and electronic device equipped with the same
- Publication number 20060003196
- Publication date Jan 5, 2006
- Ryuji Kohno
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Fuel cell having mechanism for pressurizing membrane electrode asse...
- Publication number 20060003219
- Publication date Jan 5, 2006
- Ryuji Kohno
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Measuring method and apparatus of thin film thickness
- Publication number 20050073323
- Publication date Apr 7, 2005
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Testing apparatus for carrying out inspection of a semiconductor de...
- Publication number 20050032252
- Publication date Feb 10, 2005
- Renesas Technology Corporation
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Probe structure
- Publication number 20040145382
- Publication date Jul 29, 2004
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Fabrication method of semiconductor integrated circuit device and i...
- Publication number 20040135593
- Publication date Jul 15, 2004
- Naoto Ban
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and manufacturing method thereof including a p...
- Publication number 20030203521
- Publication date Oct 30, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor inspection apparatus
- Publication number 20030189439
- Publication date Oct 9, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device testing apparatus and method for manufacturing...
- Publication number 20030122550
- Publication date Jul 3, 2003
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and a manufacturing method thereof
- Publication number 20030113944
- Publication date Jun 19, 2003
- Hitachi, Ltd
- Masatoshi Kanamaru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing a semicondutor device
- Publication number 20030104641
- Publication date Jun 5, 2003
- Hitachi, Ltd
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR-DEVICE INSPECTING APPARATUS AND A METHOD FOR MANUFACT...
- Publication number 20030102880
- Publication date Jun 5, 2003
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and test device for same
- Publication number 20030047731
- Publication date Mar 13, 2003
- Toshio Miyatake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and contactor for inspection
- Publication number 20030020158
- Publication date Jan 30, 2003
- Hideo Miura
- G01 - MEASURING TESTING
Information Patent Application
Packaging device for holding a plurality of semiconductor devices t...
- Publication number 20030015779
- Publication date Jan 23, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and manufacturing method thereof including a p...
- Publication number 20020182796
- Publication date Dec 5, 2002
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Manufacture method for semiconductor inspection apparatus
- Publication number 20020086451
- Publication date Jul 4, 2002
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing semiconductor device utilizing semiconduct...
- Publication number 20020072136
- Publication date Jun 13, 2002
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
Fabrication method of semiconductor integrated circuit device and i...
- Publication number 20020039802
- Publication date Apr 4, 2002
- Naoto Ban
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device testing apparatus and semiconductor device man...
- Publication number 20020033707
- Publication date Mar 21, 2002
- Ryuji Kohno
- G01 - MEASURING TESTING

Ryuji Kohno

Person

Patents Grantslast 30 patents

Membrane electrode composite module, fuel cell and electronic equip...

Semiconductor device and manufacturing method thereof including a p...

Probe structure

Method of manufacturing a semiconductor device

Testing apparatus for carrying out inspection of a semiconductor de...

Semiconductor device and test device for same

Semiconductor device and contractor for inspection

Packaging device for holding a plurality of semiconductor devices t...

Semiconductor device testing apparatus and semiconductor device man...

Semiconductor device testing apparatus and method for manufacturing...

Semiconductor-device inspecting apparatus and a method for manufact...

Semiconductor inspection apparatus

Fabrication method of semiconductor integrated circuit device and i...

Semiconductor device and a manufacturing method thereof

Probe structure

Semiconductor device and manufacturing method thereof including a p...

Manufacture method for semiconductor inspection apparatus

Method for manufacturing semiconductor device utilizing semiconduct...

Semiconductor testing equipment with probe formed on a cantilever o...

Semiconductor-device inspecting apparatus and a method for manufact...

Contactor for inspection

Method for producing semiconductor device and apparatus usable therein

Semiconductor device and manufacturing method thereof including a p...

Manufacture method for semiconductor inspection apparatus

Semiconductor device

TSOP type semiconductor device

Semiconductor device and manufacturing method thereof including a p...

Semiconductor device

Semiconductor device

Semiconductor device, lead frame therefor and memory card to provid...

Patents Applicationslast 30 patents

FUEL CELL SYSTEM

FUEL CELL SYSTEM

Fuel cell, refueling device for the fuel cell, and electronic devic...

Electronic components

Cell holder, fuel cell module and electronic equipment

Holding structure and electronic apparatus installing that therein

Fuel cell unit, fuel cell unit assembly and electronic equipment

Membrane electrode composite module, fuel cell and electronic equip...

Fuel cell and electronic device equipped with the same

Fuel cell having mechanism for pressurizing membrane electrode asse...

Measuring method and apparatus of thin film thickness

Testing apparatus for carrying out inspection of a semiconductor de...

Probe structure

Fabrication method of semiconductor integrated circuit device and i...

Semiconductor device and manufacturing method thereof including a p...

Semiconductor inspection apparatus

Semiconductor device testing apparatus and method for manufacturing...

Semiconductor device and a manufacturing method thereof

Method of manufacturing a semicondutor device

SEMICONDUCTOR-DEVICE INSPECTING APPARATUS AND A METHOD FOR MANUFACT...

Semiconductor device and test device for same

Semiconductor device and contactor for inspection

Packaging device for holding a plurality of semiconductor devices t...

Semiconductor device and manufacturing method thereof including a p...

Manufacture method for semiconductor inspection apparatus

Method for manufacturing semiconductor device utilizing semiconduct...

Fabrication method of semiconductor integrated circuit device and i...

Semiconductor device testing apparatus and semiconductor device man...