Ryuji Matsuo

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray topography apparatus
- Patent number 9,335,282
- Issue date May 10, 2016
- Rigaku Corporation
- Kazuhiko Omote
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray apparatus, method of using the same and X-ray irradiation method
- Patent number 9,336,917
- Issue date May 10, 2016
- Rigaku Corporation
- Tetsuya Ozawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray diffraction apparatus and X-ray diffraction measurement method
- Patent number 9,074,992
- Issue date Jul 7, 2015
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction measuring apparatus having debye-scherrer optical...
- Patent number 7,860,217
- Issue date Dec 28, 2010
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam conditioning device and X-ray analysis apparatus
- Patent number 7,684,543
- Issue date Mar 23, 2010
- Rigaku Corporation
- Ryuji Matsuo
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray optical system
- Patent number 7,542,548
- Issue date Jun 2, 2009
- Rigaku Corp.
- Ryuji Matsuo
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method of setting measuring range of reciprocal-space mapping
- Patent number 6,999,557
- Issue date Feb 14, 2006
- Rigaku Corporation
- Susumu Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Pole measuring method
- Patent number 6,937,694
- Issue date Aug 30, 2005
- Rigaku Corporation
- Ryouichi Yokoyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RADIATION MEASUREMENT APPARATUS
- Publication number 20240167968
- Publication date May 23, 2024
- Rigaku Corporation
- Takuya KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION AMOUNT SPECIFYING APPARATUS, METHOD, PROGRAM, AND JIG
- Publication number 20230152248
- Publication date May 18, 2023
- Rigaku Corporation
- Takuya KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TOPOGRAPHY APPARATUS
- Publication number 20130259200
- Publication date Oct 3, 2013
- Rigaku Corporation
- Kazuhiko OMOTE
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTION MEASUREMENT METHOD
- Publication number 20120140890
- Publication date Jun 7, 2012
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Application
X-RAY APPARATUS, METHOD OF USING THE SAME AND X-RAY IRRADIATION METHOD
- Publication number 20110268252
- Publication date Nov 3, 2011
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Diffraction Measuring Apparatus Having Debye-Scherrer Optical...
- Publication number 20090086910
- Publication date Apr 2, 2009
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Application
X-ray optical system
- Publication number 20080084967
- Publication date Apr 10, 2008
- Rigaku Corporation
- Ryuji Matsuo
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-ray beam conditioning device and X-ray analysis apparatus
- Publication number 20070003013
- Publication date Jan 4, 2007
- Rigaku Corporation
- Ryuji Matsuo
- G01 - MEASURING TESTING
Information Patent Application
Method of setting measuring range of reciprocal-space mapping
- Publication number 20040240611
- Publication date Dec 2, 2004
- Rigaku Corporation
- Susumu Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Pole measuring method
- Publication number 20030012335
- Publication date Jan 16, 2003
- Ryouichi Yokoyama
- G01 - MEASURING TESTING

Ryuji Matsuo

Person

Patents Grantslast 30 patents

X-ray topography apparatus

X-ray apparatus, method of using the same and X-ray irradiation method

X-ray diffraction apparatus and X-ray diffraction measurement method

X-ray diffraction measuring apparatus having debye-scherrer optical...

X-ray beam conditioning device and X-ray analysis apparatus

X-ray optical system

Method of setting measuring range of reciprocal-space mapping

Pole measuring method

Patents Applicationslast 30 patents

RADIATION MEASUREMENT APPARATUS

CORRECTION AMOUNT SPECIFYING APPARATUS, METHOD, PROGRAM, AND JIG

X-RAY TOPOGRAPHY APPARATUS

X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTION MEASUREMENT METHOD

X-RAY APPARATUS, METHOD OF USING THE SAME AND X-RAY IRRADIATION METHOD

X-Ray Diffraction Measuring Apparatus Having Debye-Scherrer Optical...

X-ray optical system

X-ray beam conditioning device and X-ray analysis apparatus

Method of setting measuring range of reciprocal-space mapping

Pole measuring method