Ryuji MITSUHASHI

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern measurement device, and computer program for measuring pattern
- Patent number 10,545,018
- Issue date Jan 28, 2020
- Hitachi High-Technologies Corporation
- Satoru Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Pattern Measurement Device, and Computer Program for Measuring Pattern
- Publication number 20160320182
- Publication date Nov 3, 2016
- Hitachi High-Technologies Corporation
- Satoru YAMAGUCHI
- G01 - MEASURING TESTING