Ryuji Shibata

Person

Higashiyamato, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Fabrication method of semiconductor integrated circuit device
- Patent number 7,901,958
- Issue date Mar 8, 2011
- Renesas Electronics Corporation
- Masayoshi Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method of designing semiconductor integrated circuit device and sem...
- Patent number 7,642,601
- Issue date Jan 5, 2010
- Renesas Technology Corp.
- Ryuji Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of designing semiconductor integrated circuit device and sem...
- Patent number 7,541,647
- Issue date Jun 2, 2009
- Renesas Technology Corp.
- Ryuji Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 6,912,697
- Issue date Jun 28, 2005
- Renesas Technology Corp.
- Ryuji Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of designing semiconductor integrated circuit device and sem...
- Patent number 6,611,943
- Issue date Aug 26, 2003
- Hitachi, Ltd.
- Ryuji Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of designing semiconductor integrated circuit device and sem...
- Patent number 6,462,978
- Issue date Oct 8, 2002
- Hitachi, Ltd.
- Ryuji Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of designing semiconductor integrated circuit device and sem...
- Patent number 6,340,825
- Issue date Jan 22, 2002
- Hitachi, Ltd.
- Ryuji Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device having an internally produc...
- Patent number 5,568,083
- Issue date Oct 22, 1996
- Hitachi, Ltd.
- Akira Uchiyama
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of designing cells applicable to different design automation...
- Patent number 5,348,902
- Issue date Sep 20, 1994
- Hitachi, Ltd.
- Shigeru Shimada
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20110175634
- Publication date Jul 21, 2011
- Masayoshi Okamoto
- G01 - MEASURING TESTING
Information Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20110136272
- Publication date Jun 9, 2011
- Masayoshi Okamoto
- G01 - MEASURING TESTING
Information Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20100304510
- Publication date Dec 2, 2010
- Masayoshi Okamoto
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DESIGNING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND SEM...
- Publication number 20090218626
- Publication date Sep 3, 2009
- Ryuji Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20080020498
- Publication date Jan 24, 2008
- Masayoshi Okamoto
- G01 - MEASURING TESTING
Information Patent Application
Method of designing semiconductor integrated circuit device and sem...
- Publication number 20050281119
- Publication date Dec 22, 2005
- Ryuji Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fabrication method of semiconductor integrated circuit device
- Publication number 20050093565
- Publication date May 5, 2005
- Masayoshi Okamoto
- G01 - MEASURING TESTING
Information Patent Application
Method of designing semiconductor integrated circuit device and sem...
- Publication number 20030208725
- Publication date Nov 6, 2003
- Ryuji Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of designing semiconductor integrated circuit device and sem...
- Publication number 20020043667
- Publication date Apr 18, 2002
- Ryuji Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of designing semiconductor integrated circuit device and sem...
- Publication number 20020024064
- Publication date Feb 28, 2002
- Ryuji Shibata
- H01 - BASIC ELECTRIC ELEMENTS

Ryuji Shibata

Person

Patents Grantslast 30 patents

Fabrication method of semiconductor integrated circuit device

Method of designing semiconductor integrated circuit device and sem...

Method of designing semiconductor integrated circuit device and sem...

Semiconductor integrated circuit device

Method of designing semiconductor integrated circuit device and sem...

Method of designing semiconductor integrated circuit device and sem...

Method of designing semiconductor integrated circuit device and sem...

Semiconductor integrated circuit device having an internally produc...

Method of designing cells applicable to different design automation...

Patents Applicationslast 30 patents

FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

METHOD OF DESIGNING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND SEM...

FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

Method of designing semiconductor integrated circuit device and sem...

Fabrication method of semiconductor integrated circuit device

Method of designing semiconductor integrated circuit device and sem...

Method of designing semiconductor integrated circuit device and sem...

Method of designing semiconductor integrated circuit device and sem...