Ryuji Shimizu

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Uninterruptible power supply apparatus
- Patent number 9,673,625
- Issue date Jun 6, 2017
- Fuji Electric Co., Ltd.
- Ryuji Yamada
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Delay failure test circuit
- Patent number 7,640,124
- Issue date Dec 29, 2009
- Fujitsu Microelectronics Limited
- Hideaki Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for supporting designing of LSI, and computer...
- Patent number 7,315,997
- Issue date Jan 1, 2008
- Fujitsu Limited
- Hitoshi Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in self-test circuit
- Patent number 7,117,394
- Issue date Oct 3, 2006
- Fujitsu Limited
- Ryuji Shimizu
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of and apparatus for timing verification of LSI test data an...
- Patent number 6,910,166
- Issue date Jun 21, 2005
- Fujitsu Limited
- Masahito Suzuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
RAM functional test facilitation circuit with reduced scale
- Patent number 6,810,498
- Issue date Oct 26, 2004
- Fujitsu Limited
- Ryuji Shimizu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
UNINTERRUPTIBLE POWER SUPPLY APPARATUS
- Publication number 20150180233
- Publication date Jun 25, 2015
- Fuji Electric Co., Ltd.
- Ryuji YAMADA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Delay failure test circuit
- Publication number 20070288184
- Publication date Dec 13, 2007
- FUJITSU LIMITED
- Hideaki Konishi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for supporting designing of LSI, and computer...
- Publication number 20050172254
- Publication date Aug 4, 2005
- FUJITSU LIMITED
- Hitoshi Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Built-in self-test circuit
- Publication number 20040088621
- Publication date May 6, 2004
- FUJITSU LIMITED
- Ryuji Shimizu
- G01 - MEASURING TESTING
Information Patent Application
Method of and apparatus for timing verification of LSI test data an...
- Publication number 20030093729
- Publication date May 15, 2003
- FUJITSU LIMITED
- Masahito Suzuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RAM functional test facilitation circuit with reduced scale
- Publication number 20020162064
- Publication date Oct 31, 2002
- FUJITSU LIMITED
- Ryuji Shimizu
- G11 - INFORMATION STORAGE