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Ryusuke Hirose
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for analyzing evolved gas
Patent number
11,646,188
Issue date
May 9, 2023
Hitachi High-Tech Science Corporation
Ryusuke Hirose
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for and method of mass analysis
Patent number
10,969,319
Issue date
Apr 6, 2021
Hitachi High-Tech Science Corporation
Ryusuke Hirose
G01 - MEASURING TESTING
Information
Patent Grant
X-ray generator and fluorescent X-ray analyzer
Patent number
9,721,749
Issue date
Aug 1, 2017
Hitachi High-Tech Science Corporation
Ryusuke Hirose
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
X-ray analyzer
Patent number
9,658,175
Issue date
May 23, 2017
Hitachi High-Tech Science Corporation
Ryusuke Hirose
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence analyzer
Patent number
9,612,214
Issue date
Apr 4, 2017
Hitachi High-Tech Science Corporation
Haruo Takahashi
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray fluorescence spectrometer comprising a temperature sensor, tw...
Patent number
9,410,906
Issue date
Aug 9, 2016
Hitachi High-Tech Science Corporation
Ryusuke Hirose
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
MASS SPECTROMETRY METHOD AND MASS SPECTROMETER
Publication number
20230307219
Publication date
Sep 28, 2023
HITACHI HIGH-TECH CORPORATION
Ryusuke HIROSE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS AND METHOD FOR ANALYZING EVOLVED GAS
Publication number
20190027353
Publication date
Jan 24, 2019
HITACHI HIGH-TECH SCIENCE CORPORATION
Ryusuke HIROSE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS FOR AND METHOD OF MASS ANALYSIS
Publication number
20190025173
Publication date
Jan 24, 2019
HITACHI HIGH-TECH SCIENCE CORPORATION
Ryusuke HIROSE
G01 - MEASURING TESTING
Information
Patent Application
X-RAY GENERATOR AND FLUORESCENT X-RAY ANALYZER
Publication number
20160118215
Publication date
Apr 28, 2016
HITACHI HIGH-TECH SCIENCE CORPORATION
Ryusuke HIROSE
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE ANALYZER
Publication number
20150362445
Publication date
Dec 17, 2015
HITACHI HIGH-TECH SCIENCE CORPORATION
Haruo TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
X-RAY ANALYZER
Publication number
20150268180
Publication date
Sep 24, 2015
HITACHI HIGH-TECH SCIENCE CORPORATION
Ryusuke HIROSE
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Fluorescence Spectrometer
Publication number
20140294145
Publication date
Oct 2, 2014
HITACHI HIGH-TECH SCIENCE CORPORATION
Ryusuke Hirose
G01 - MEASURING TESTING